A design methodology of crystal growth furnace and process aided by two-step optimization using machine learning models and genetic algorithm
- ジャーナル論文
- 著者
-
;Hiroyuki Tanaka (author) (この著者で検索)Nagoya University a Graduate School of Engineering;Kentaro Kutsukake (author) (この著者で検索);Kota Asakura (author) (この著者で検索);Takuto Kojima (author) (この著者で検索);Xin Liu (author) (この著者で検索)Noritaka Usami (author) (この著者で検索)
- キーワード
- Optimization, machine learning, genetic algorithm, crystal growth, process informatics
- 刊行年月日
- 2025-12-31
- 更新時刻
- 2026-02-27 12:30:07 +0900
Reproducible Chiroptical Activity from Aggregated Chiral Thienopyrroledione–Fluorene π‑Conjugated Polymers.
- ジャーナル論文
- 著者
-
;Nao Suzuki (author) (この著者で検索)University of Tsukuba a Institute of Pure and Applied Sciences;Ziwei Hu (author) (この著者で検索);Sota Nakayama (author) (この著者で検索);Soh Kushida (author) (この著者で検索);Yohei Yamamoto (author) (この著者で検索);Wijak Yospanya (author) (この著者で検索);Reiko Oda (author) (この著者で検索);Takaki Kanbara (author) (この著者で検索)Junpei Kuwabara (author) (この著者で検索)
- キーワード
- Chiral π‑conjugated polymer, thienopyrroledione, circular dichroism, circularly polarized luminescence
- 刊行年月日
- 2026-06-02
- 更新時刻
- 2026-06-19 13:05:19 +0900
Deep learning framework for analyzing birefringence imaging by incorporating optical polarization overlap in stress-induced ferroelectric SrTiO
- ジャーナル論文
- 著者
-
;Hirotaka Manaka (author) (この著者で検索)Kagoshima University a Graduate School of Science and Engineering;Shoutarou Katayama (author) (この著者で検索);Soichiro Honda (author) (この著者で検索)Yoko Miura (author) (この著者で検索)
- キーワード
- LSTM, temperature series principal component analysis, 3D convolutional autoencoder, temperature series forest, stress-induced ferroelectricity, SrTiO3
- 刊行年月日
- 2025-12-31
- 更新時刻
- 2025-10-21 16:05:44 +0900
Thermal spin transport phenomena and their correlation to magnetic properties of metallic Pt/Co1-xFex and Pt/Ni1-xFex bilayers
- ジャーナル論文
- 著者
-
;Panagiota Bougiatioti (author) (この著者で検索)Bielefeld University a Faculty of Physics;Orestis Manos (author) (この著者で検索);Günter Reiss (author) (この著者で検索)Timo Kuschel (author) (この著者で検索)
- キーワード
- Spin Seebeck effect, anomalous nernst effect, magnetic proximity effect
- 刊行年月日
- 2025-12-31
- 更新時刻
- 2025-12-05 16:30:09 +0900
Pulsed laser deposition of ZnO/MgxZn1-xO superlattices for quantum cascade laser applications
- ジャーナル論文
- 著者
-
;Tatsuya Masuda (author) (この著者で検索)a Smart Combinatorial Technology;Toshihiro Sato (author) (この著者で検索);Norihiko Sekine (author) (この著者で検索);Iwao Hosako (author) (この著者で検索);Gen-Ichi Hatakoshi (author) (この著者で検索);Hideomi Koinuma (author) (この著者で検索)Ryota Takahashi (author) (この著者で検索)
- キーワード
- Pulsed laser deposition, quantum cascade laser, ZnO/MgxZn1-xO superlattices
- 刊行年月日
- 2026-07-16
- 更新時刻
- 2026-07-17 14:49:14 +0900
Raw data files for Fig. 12 Auger depth profiles in "Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam"
- データセット
- 著者
-
OGIWARA, Toshiya (author) (この著者で検索)National Institute for Materials Science
;
NAGATA, Takahiro (author) (この著者で検索)National Institute for Materials Science
;
YOSHIKAWA, Hideki (author) (この著者で検索)National Institute for Materials Science
- キーワード
- Auger depth profiling analysis, HfO2/Si, Ultra low angle incidence ion beam
- 刊行年月日
- 2019-03-07
- 更新時刻
- 2024-01-05 22:13:20 +0900
Raw data files for Fig. 11 Auger depth profiles in "Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam"
- データセット
- 著者
-
OGIWARA, Toshiya (author) (この著者で検索)National Institute for Materials Science
;
NAGATA, Takahiro (author) (この著者で検索)National Institute for Materials Science
;
YOSHIKAWA, Hideki (author) (この著者で検索)National Institute for Materials Science
- キーワード
- Auger depth profiling analysis, HfO2/Si, Ultra low angle incidence ion beam
- 刊行年月日
- 2019-03-07
- 更新時刻
- 2024-04-07 22:57:41 +0900
Raw data files for Fig. 10 Auger depth profiles in "Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam"
- データセット
- 著者
-
OGIWARA, Toshiya (author) (この著者で検索)National Institute for Materials Science
;
NAGATA, Takahiro (author) (この著者で検索)National Institute for Materials Science
;
YOSHIKAWA, Hideki (author) (この著者で検索)National Institute for Materials Science
- キーワード
- Auger depth profiling analysis, HfO2/Si, Ultra low angle incidence ion beam
- 刊行年月日
- 2019-03-07
- 更新時刻
- 2024-01-05 22:12:41 +0900
Raw data files for Fig. 9 Auger depth profiles in "Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam"
- データセット
- 著者
-
OGIWARA, Toshiya (author) (この著者で検索)National Institute for Materials Science
;
NAGATA, Takahiro (author) (この著者で検索)National Institute for Materials Science
;
YOSHIKAWA, Hideki (author) (この著者で検索)National Institute for Materials Science
- キーワード
- Auger depth profiling analysis, HfO2/Si, Ultra low angle incidence ion beam
- 刊行年月日
- 2019-03-07
- 更新時刻
- 2024-10-08 12:20:27 +0900
Raw data files for Fig. 5 Auger depth profiles in "Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam"
- データセット
- 著者
-
OGIWARA, Toshiya (author) (この著者で検索)National Institute for Materials Science
;
NAGATA, Takahiro (author) (この著者で検索)National Institute for Materials Science
;
YOSHIKAWA, Hideki (author) (この著者で検索)National Institute for Materials Science
- キーワード
- Auger depth profiling analysis, HfO2/Si, Ultra low angle incidence ion beam
- 刊行年月日
- 2019-03-07
- 更新時刻
- 2024-03-30 18:50:38 +0900