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102 件のレコードが見つかりました。

ジャーナル論文
A design methodology of crystal growth furnace and process aided by two-step optimization using machine learning models and genetic algorithm
ジャーナル論文
著者
Hiroyuki Tanaka (author) (この著者で検索)
Nagoya University a Graduate School of Engineering
;
Kentaro Kutsukake (author) (この著者で検索)
;
Kota Asakura (author) (この著者で検索)
;
Takuto Kojima (author) (この著者で検索)
;
Xin Liu (author) (この著者で検索)
;
Noritaka Usami (author) (この著者で検索)
キーワード
Optimization, machine learning, genetic algorithm, crystal growth, process informatics
刊行年月日
2025-12-31
更新時刻
2026-02-27 12:30:07 +0900

Reproducible chiroptical activity from aggregated chiral thienopyrroledione fluorene   conjugated polymers.pdf
Reproducible Chiroptical Activity from Aggregated Chiral Thienopyrroledione–Fluorene π‑Conjugated Polymers.
ジャーナル論文
著者
Nao Suzuki (author) (この著者で検索)
University of Tsukuba a Institute of Pure and Applied Sciences
;
Ziwei Hu (author) (この著者で検索)
;
Sota Nakayama (author) (この著者で検索)
;
Soh Kushida (author) (この著者で検索)
;
Yohei Yamamoto (author) (この著者で検索)
;
Wijak Yospanya (author) (この著者で検索)
;
Reiko Oda (author) (この著者で検索)
;
Takaki Kanbara (author) (この著者で検索)
;
Junpei Kuwabara (author) (この著者で検索)
キーワード
Chiral π‑conjugated polymer, thienopyrroledione, circular dichroism, circularly polarized luminescence
刊行年月日
2026-06-02
更新時刻
2026-06-19 13:05:19 +0900

Deep learning framework for analyzing birefringence imaging by incorporating optical polarization overlap in stress-induced ferroelectric SrTiO.pdf
Deep learning framework for analyzing birefringence imaging by incorporating optical polarization overlap in stress-induced ferroelectric SrTiO
ジャーナル論文
著者
Hirotaka Manaka (author) (この著者で検索)
Kagoshima University a Graduate School of Science and Engineering
;
Shoutarou Katayama (author) (この著者で検索)
;
Soichiro Honda (author) (この著者で検索)
;
Yoko Miura (author) (この著者で検索)
キーワード
LSTM, temperature series principal component analysis, 3D convolutional autoencoder, temperature series forest, stress-induced ferroelectricity, SrTiO3
刊行年月日
2025-12-31
更新時刻
2025-10-21 16:05:44 +0900

Thermal spin transport phenomena and their correlation to magnetic properties of metallic Pt Co1 xFe x and Pt Ni1 xFe x bilayers.pdf
Thermal spin transport phenomena and their correlation to magnetic properties of metallic Pt/Co1-xFex and Pt/Ni1-xFex bilayers
ジャーナル論文
著者
Panagiota Bougiatioti (author) (この著者で検索)
Bielefeld University a Faculty of Physics
;
Orestis Manos (author) (この著者で検索)
;
Günter Reiss (author) (この著者で検索)
;
Timo Kuschel (author) (この著者で検索)
キーワード
Spin Seebeck effect, anomalous nernst effect, magnetic proximity effect
刊行年月日
2025-12-31
更新時刻
2025-12-05 16:30:09 +0900

HfO2-Fig12-Work-20230803.pdf
Raw data files for Fig. 12 Auger depth profiles in "Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam"
データセット
著者
OGIWARA, Toshiya (author) (この著者で検索)
ORCID SAMURAI ;
NAGATA, Takahiro (author) (この著者で検索)
ORCID SAMURAI ;
YOSHIKAWA, Hideki (author) (この著者で検索)
ORCID SAMURAI
キーワード
Auger depth profiling analysis, HfO2/Si, Ultra low angle incidence ion beam
刊行年月日
2019-03-07
更新時刻
2024-01-05 22:13:20 +0900

HfO2-Fig11-Work-20230710.pdf
Raw data files for Fig. 11 Auger depth profiles in "Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam"
データセット
著者
OGIWARA, Toshiya (author) (この著者で検索)
ORCID SAMURAI ;
NAGATA, Takahiro (author) (この著者で検索)
ORCID SAMURAI ;
YOSHIKAWA, Hideki (author) (この著者で検索)
ORCID SAMURAI
キーワード
Auger depth profiling analysis, HfO2/Si, Ultra low angle incidence ion beam
刊行年月日
2019-03-07
更新時刻
2024-04-07 22:57:41 +0900

HfO2-Fig10-Work-20230606.pdf
Raw data files for Fig. 10 Auger depth profiles in "Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam"
データセット
著者
OGIWARA, Toshiya (author) (この著者で検索)
ORCID SAMURAI ;
NAGATA, Takahiro (author) (この著者で検索)
ORCID SAMURAI ;
YOSHIKAWA, Hideki (author) (この著者で検索)
ORCID SAMURAI
キーワード
Auger depth profiling analysis, HfO2/Si, Ultra low angle incidence ion beam
刊行年月日
2019-03-07
更新時刻
2024-01-05 22:12:41 +0900

HfO2-Fig9-Work-20230518.pdf
Raw data files for Fig. 9 Auger depth profiles in "Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam"
データセット
著者
OGIWARA, Toshiya (author) (この著者で検索)
ORCID SAMURAI ;
NAGATA, Takahiro (author) (この著者で検索)
ORCID SAMURAI ;
YOSHIKAWA, Hideki (author) (この著者で検索)
ORCID SAMURAI
キーワード
Auger depth profiling analysis, HfO2/Si, Ultra low angle incidence ion beam
刊行年月日
2019-03-07
更新時刻
2024-10-08 12:20:27 +0900

HfO2-Fig5-Work-20230419.pdf
Raw data files for Fig. 5 Auger depth profiles in "Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam"
データセット
著者
OGIWARA, Toshiya (author) (この著者で検索)
ORCID SAMURAI ;
NAGATA, Takahiro (author) (この著者で検索)
ORCID SAMURAI ;
YOSHIKAWA, Hideki (author) (この著者で検索)
ORCID SAMURAI
キーワード
Auger depth profiling analysis, HfO2/Si, Ultra low angle incidence ion beam
刊行年月日
2019-03-07
更新時刻
2024-03-30 18:50:38 +0900

HfO2-Fig6-Work-20230118.pdf
Raw data files for Fig. 6 Auger depth profiles in "Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam"
データセット
著者
OGIWARA, Toshiya (author) (この著者で検索)
ORCID SAMURAI ;
NAGATA, Takahiro (author) (この著者で検索)
ORCID SAMURAI ;
YOSHIKAWA, Hideki (author) (この著者で検索)
ORCID SAMURAI
キーワード
Auger depth profiling analysis, HfO2/Si, Ultra low angle incidence ion beam
刊行年月日
2019-03-07
更新時刻
2024-03-30 18:50:25 +0900