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102 件のレコードが見つかりました。
A design methodology of crystal growth furnace and process aided by two-step optimization using machine learning models and genetic algorithm
ジャーナル論文
著者
Hiroyuki Tanaka
(author) (
この著者で検索
)
Nagoya University a Graduate School of Engineering
Hiroyuki Tanaka
;
Kentaro Kutsukake
(author) (
この著者で検索
)
Kentaro Kutsukake
;
Kota Asakura
(author) (
この著者で検索
)
Kota Asakura
;
Takuto Kojima
(author) (
この著者で検索
)
Takuto Kojima
;
Xin Liu
(author) (
この著者で検索
)
Xin Liu
;
Noritaka Usami
(author) (
この著者で検索
)
Noritaka Usami
キーワード
Optimization
,
machine learning
,
genetic algorithm
,
crystal growth
,
process informatics
刊行年月日
2025-12-31
更新時刻
2026-02-27 12:30:07 +0900
Reproducible Chiroptical Activity from Aggregated Chiral Thienopyrroledione–Fluorene π‑Conjugated Polymers.
ジャーナル論文
著者
Nao Suzuki
(author) (
この著者で検索
)
University of Tsukuba a Institute of Pure and Applied Sciences
Nao Suzuki
;
Ziwei Hu
(author) (
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)
Ziwei Hu
;
Sota Nakayama
(author) (
この著者で検索
)
Sota Nakayama
;
Soh Kushida
(author) (
この著者で検索
)
Soh Kushida
;
Yohei Yamamoto
(author) (
この著者で検索
)
Yohei Yamamoto
;
Wijak Yospanya
(author) (
この著者で検索
)
Wijak Yospanya
;
Reiko Oda
(author) (
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)
Reiko Oda
;
Takaki Kanbara
(author) (
この著者で検索
)
Takaki Kanbara
;
Junpei Kuwabara
(author) (
この著者で検索
)
Junpei Kuwabara
キーワード
Chiral π‑conjugated polymer
,
thienopyrroledione
,
circular dichroism
,
circularly polarized luminescence
刊行年月日
2026-06-02
更新時刻
2026-06-19 13:05:19 +0900
Deep learning framework for analyzing birefringence imaging by incorporating optical polarization overlap in stress-induced ferroelectric SrTiO
ジャーナル論文
著者
Hirotaka Manaka
(author) (
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)
Kagoshima University a Graduate School of Science and Engineering
Hirotaka Manaka
;
Shoutarou Katayama
(author) (
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)
Shoutarou Katayama
;
Soichiro Honda
(author) (
この著者で検索
)
Soichiro Honda
;
Yoko Miura
(author) (
この著者で検索
)
Yoko Miura
キーワード
LSTM
,
temperature series principal component analysis
,
3D convolutional autoencoder
,
temperature series forest
,
stress-induced ferroelectricity
,
SrTiO3
刊行年月日
2025-12-31
更新時刻
2025-10-21 16:05:44 +0900
Thermal spin transport phenomena and their correlation to magnetic properties of metallic Pt/Co1-xFex and Pt/Ni1-xFex bilayers
ジャーナル論文
著者
Panagiota Bougiatioti
(author) (
この著者で検索
)
Bielefeld University a Faculty of Physics
Panagiota Bougiatioti
;
Orestis Manos
(author) (
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)
Orestis Manos
;
Günter Reiss
(author) (
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)
Günter Reiss
;
Timo Kuschel
(author) (
この著者で検索
)
Timo Kuschel
キーワード
Spin Seebeck effect
,
anomalous nernst effect
,
magnetic proximity effect
刊行年月日
2025-12-31
更新時刻
2025-12-05 16:30:09 +0900
Raw data files for Fig. 12 Auger depth profiles in "Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam"
データセット
著者
OGIWARA, Toshiya
(author) (
この著者で検索
)
https://orcid.org/0000-0002-7376-6571
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
OGIWARA, Toshiya
;
NAGATA, Takahiro
(author) (
この著者で検索
)
https://orcid.org/0000-0002-8591-2943
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
NAGATA, Takahiro
;
YOSHIKAWA, Hideki
(author) (
この著者で検索
)
https://orcid.org/0000-0002-7389-8865
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
YOSHIKAWA, Hideki
キーワード
Auger depth profiling analysis
,
HfO2/Si
,
Ultra low angle incidence ion beam
刊行年月日
2019-03-07
更新時刻
2024-01-05 22:13:20 +0900
Raw data files for Fig. 11 Auger depth profiles in "Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam"
データセット
著者
OGIWARA, Toshiya
(author) (
この著者で検索
)
https://orcid.org/0000-0002-7376-6571
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
OGIWARA, Toshiya
;
NAGATA, Takahiro
(author) (
この著者で検索
)
https://orcid.org/0000-0002-8591-2943
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
NAGATA, Takahiro
;
YOSHIKAWA, Hideki
(author) (
この著者で検索
)
https://orcid.org/0000-0002-7389-8865
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
YOSHIKAWA, Hideki
キーワード
Auger depth profiling analysis
,
HfO2/Si
,
Ultra low angle incidence ion beam
刊行年月日
2019-03-07
更新時刻
2024-04-07 22:57:41 +0900
Raw data files for Fig. 10 Auger depth profiles in "Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam"
データセット
著者
OGIWARA, Toshiya
(author) (
この著者で検索
)
https://orcid.org/0000-0002-7376-6571
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
OGIWARA, Toshiya
;
NAGATA, Takahiro
(author) (
この著者で検索
)
https://orcid.org/0000-0002-8591-2943
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
NAGATA, Takahiro
;
YOSHIKAWA, Hideki
(author) (
この著者で検索
)
https://orcid.org/0000-0002-7389-8865
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
YOSHIKAWA, Hideki
キーワード
Auger depth profiling analysis
,
HfO2/Si
,
Ultra low angle incidence ion beam
刊行年月日
2019-03-07
更新時刻
2024-01-05 22:12:41 +0900
Raw data files for Fig. 9 Auger depth profiles in "Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam"
データセット
著者
OGIWARA, Toshiya
(author) (
この著者で検索
)
https://orcid.org/0000-0002-7376-6571
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
OGIWARA, Toshiya
;
NAGATA, Takahiro
(author) (
この著者で検索
)
https://orcid.org/0000-0002-8591-2943
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
NAGATA, Takahiro
;
YOSHIKAWA, Hideki
(author) (
この著者で検索
)
https://orcid.org/0000-0002-7389-8865
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
YOSHIKAWA, Hideki
キーワード
Auger depth profiling analysis
,
HfO2/Si
,
Ultra low angle incidence ion beam
刊行年月日
2019-03-07
更新時刻
2024-10-08 12:20:27 +0900
Raw data files for Fig. 5 Auger depth profiles in "Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam"
データセット
著者
OGIWARA, Toshiya
(author) (
この著者で検索
)
https://orcid.org/0000-0002-7376-6571
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
OGIWARA, Toshiya
;
NAGATA, Takahiro
(author) (
この著者で検索
)
https://orcid.org/0000-0002-8591-2943
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
NAGATA, Takahiro
;
YOSHIKAWA, Hideki
(author) (
この著者で検索
)
https://orcid.org/0000-0002-7389-8865
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
YOSHIKAWA, Hideki
キーワード
Auger depth profiling analysis
,
HfO2/Si
,
Ultra low angle incidence ion beam
刊行年月日
2019-03-07
更新時刻
2024-03-30 18:50:38 +0900
Raw data files for Fig. 6 Auger depth profiles in "Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam"
データセット
著者
OGIWARA, Toshiya
(author) (
この著者で検索
)
https://orcid.org/0000-0002-7376-6571
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
OGIWARA, Toshiya
;
NAGATA, Takahiro
(author) (
この著者で検索
)
https://orcid.org/0000-0002-8591-2943
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
NAGATA, Takahiro
;
YOSHIKAWA, Hideki
(author) (
この著者で検索
)
https://orcid.org/0000-0002-7389-8865
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
YOSHIKAWA, Hideki
キーワード
Auger depth profiling analysis
,
HfO2/Si
,
Ultra low angle incidence ion beam
刊行年月日
2019-03-07
更新時刻
2024-03-30 18:50:25 +0900
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RDEメタデータ定義
RDE送り状
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