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- In Copyright (11)
- Creative Commons BY-NC Attribution-NonCommercial 4.0 International (10)
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- Creative Commons BY-ND Attribution-NoDerivatives 4.0 International (1)
Free Analysis and Visualization Programs for Electrochemical Impedance Spectroscopy Coded in Python
- ジャーナル論文
- 著者
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KOBAYASHI, Kiyoshi (author) (この著者で検索)
;
SUZUKI, Tohru S. (author) (この著者で検索) - キーワード
- model fitting, free software, electrochemical impedance, data visualization
- 刊行年月日
- 2021-03-05
- 更新時刻
- 2024-01-05 22:11:18 +0900
Group 8 metallocenes as single-source precursors for the synthesis of light-element-stabilized FCC phases under extreme conditions
- ジャーナル論文
- 著者
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;Ken Niwa (author) (この著者で検索)Nagoya University a Research Center for Crystalline Materials Engineering, Faculty of Engineering;Kenta Nakashima (author) (この著者で検索);Yusuke Kimura (author) (この著者で検索);Nico Alexander Gaida (author) (この著者で検索);Takuya Sasaki (author) (この著者で検索)Masashi Hasegawa (author) (この著者で検索)
- キーワード
- Metallocenes, high pressure synthesis, laser-heated diamond-anvil cell, high pressure in situ measurement
- 刊行年月日
- 2026-12-31
- 更新時刻
- 2026-06-24 11:49:59 +0900
Pulsed laser deposition of ZnO/MgxZn1-xO superlattices for quantum cascade laser applications
- ジャーナル論文
- 著者
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;Tatsuya Masuda (author) (この著者で検索)a Smart Combinatorial Technology;Toshihiro Sato (author) (この著者で検索);Norihiko Sekine (author) (この著者で検索);Iwao Hosako (author) (この著者で検索);Gen-Ichi Hatakoshi (author) (この著者で検索);Hideomi Koinuma (author) (この著者で検索)Ryota Takahashi (author) (この著者で検索)
- キーワード
- Pulsed laser deposition, quantum cascade laser, ZnO/MgxZn1-xO superlattices
- 刊行年月日
- 2026-07-16
- 更新時刻
- 2026-07-17 14:49:14 +0900
Orthogonal spectroscopic assessment of higher-order structure of nucleic acids and its concentration-dependent polymorphism
- データセット
- 著者
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;Taiji Oyama (author) (この著者で検索)JASCO Corporation;Satoko Suzuki (author) (この著者で検索)JASCO Corporation;Ken-ichi Akaoa (author) (この著者で検索)JASCO Corporation;Kazunori Ikebukurob (author) (この著者で検索)Tokyo University of Agriculture and TechnologyKohsaku Kawakami (author) (この著者で検索)National Institute for Materials Science External Collaboration Division/Materials Open Platform for Pharmaceutical Science
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Tomohiko Yamazaki (author) (この著者で検索)National Institute for Materials Science Research Center for Macromolecules and Biomaterials/Biomaterials Field/Medical Soft Matter Group
- キーワード
- Circular Dichroism spectrum, Raman spectrum, Fourier Transform Infrared spectrum, Fluorescence spctrum, Atomic Force Microscope
- 刊行年月日
- 更新時刻
- 2026-08-27 15:52:20 +0900
Estimation of valence state and growth rate using principal component analysis of plasma emission in reactive sputtering deposition
- ジャーナル論文
- 著者
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;Rintaro Minami (author) (この著者で検索)University of Tsukuba a Department of Applied Physics;Eiji Kita (author) (この著者で検索);Chiharu Mitsumata (author) (この著者で検索)Hideto Yanagihara (author) (この著者で検索)
- キーワード
- Machine learning, principal component analysis (PCA), reactive magnetron sputtering, plasma emission spectrum, Mössbauer spectroscopy
- 刊行年月日
- 2025-12-31
- 更新時刻
- 2025-09-10 16:30:38 +0900
Raw data files for Fig. 12 Auger depth profiles in "Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam"
- データセット
- 著者
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OGIWARA, Toshiya (author) (この著者で検索)National Institute for Materials Science
;
NAGATA, Takahiro (author) (この著者で検索)National Institute for Materials Science
;
YOSHIKAWA, Hideki (author) (この著者で検索)National Institute for Materials Science
- キーワード
- Auger depth profiling analysis, HfO2/Si, Ultra low angle incidence ion beam
- 刊行年月日
- 2019-03-07
- 更新時刻
- 2024-01-05 22:13:20 +0900
Raw data files for Fig. 11 Auger depth profiles in "Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam"
- データセット
- 著者
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OGIWARA, Toshiya (author) (この著者で検索)National Institute for Materials Science
;
NAGATA, Takahiro (author) (この著者で検索)National Institute for Materials Science
;
YOSHIKAWA, Hideki (author) (この著者で検索)National Institute for Materials Science
- キーワード
- Auger depth profiling analysis, HfO2/Si, Ultra low angle incidence ion beam
- 刊行年月日
- 2019-03-07
- 更新時刻
- 2024-04-07 22:57:41 +0900
Raw data files for Fig. 10 Auger depth profiles in "Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam"
- データセット
- 著者
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OGIWARA, Toshiya (author) (この著者で検索)National Institute for Materials Science
;
NAGATA, Takahiro (author) (この著者で検索)National Institute for Materials Science
;
YOSHIKAWA, Hideki (author) (この著者で検索)National Institute for Materials Science
- キーワード
- Auger depth profiling analysis, HfO2/Si, Ultra low angle incidence ion beam
- 刊行年月日
- 2019-03-07
- 更新時刻
- 2024-01-05 22:12:41 +0900
Raw data files for Fig. 9 Auger depth profiles in "Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam"
- データセット
- 著者
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OGIWARA, Toshiya (author) (この著者で検索)National Institute for Materials Science
;
NAGATA, Takahiro (author) (この著者で検索)National Institute for Materials Science
;
YOSHIKAWA, Hideki (author) (この著者で検索)National Institute for Materials Science
- キーワード
- Auger depth profiling analysis, HfO2/Si, Ultra low angle incidence ion beam
- 刊行年月日
- 2019-03-07
- 更新時刻
- 2024-10-08 12:20:27 +0900
Raw data files for Fig. 5 Auger depth profiles in "Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam"
- データセット
- 著者
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OGIWARA, Toshiya (author) (この著者で検索)National Institute for Materials Science
;
NAGATA, Takahiro (author) (この著者で検索)National Institute for Materials Science
;
YOSHIKAWA, Hideki (author) (この著者で検索)National Institute for Materials Science
- キーワード
- Auger depth profiling analysis, HfO2/Si, Ultra low angle incidence ion beam
- 刊行年月日
- 2019-03-07
- 更新時刻
- 2024-03-30 18:50:38 +0900