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18 件のレコードが見つかりました。 1件目から10件目まで表示します。

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Electron doping of exfoliated multilayer graphene induced by dissociative H2 adsorption due to long-term exposure to 80-bar H2 gas.pdf
Electron doping of exfoliated multilayer graphene induced by dissociative H2 adsorption due to long-term exposure to 80-bar H2 gas
ジャーナル論文
著者
Hyun-Seok Jang (author) (この著者で検索)
Incheon National University a Department of Physics
;
Younghun Kim (author) (この著者で検索)
;
Heewoo Lee (author) (この著者で検索)
;
Soo Bong Choi (author) (この著者で検索)
;
Jeongwoo Kim (author) (この著者で検索)
;
Byung Hoon Kim (author) (この著者で検索)
キーワード
Multilayer graphene, high H2 pressure, dissociative H2 adsorption, hydrogen electron-doped graphene
刊行年月日
2026-12-31
更新時刻
2026-02-10 12:30:21 +0900
Supplemental_material_v4.pdf
Computational material screening for electrode materials of BaSi2 solar cells
ジャーナル論文
著者
Tomoaki Yazaki (author) (この著者で検索)
University of Yamanashi a Center for Crystal Science and Technology
;
Keisuke Arimoto (author) (この著者で検索)
;
Junji Yamanaka (author) (この著者で検索)
;
Kosuke O. Hara (author) (この著者で検索)
キーワード
Solar cells, metallic electrode, high-throughput virtual screening, work function, melting point, density functional theory
刊行年月日
2026-12-31
更新時刻
2026-03-07 12:30:04 +0900
Surface-structure search with variable composition and periodicity via machine learning and evolutionary algorithms applications to Pt Ge oxidation a.pdf
Surface-Structure Search with Variable Composition and Periodicity via Machine Learning and Evolutionary Algorithms: Applications to Pt/Ge Oxidation and Au--Sn Alloying
ジャーナル論文
著者
F. Kuroda (author) (この著者で検索)
National Institute of Advanced Industrial Science and Technology (AIST) a Materials DX Research Center
;
M. Otani (author) (この著者で検索)
キーワード
Sections, lists, figures, tables, mathematics, fonts, references, appendices
刊行年月日
2026-07-07
更新時刻
2026-07-08 16:54:06 +0900
Research data express a data accumulation and sharing system for digital transformation in materials research.pdf
Research Data Express: a data accumulation and sharing system for digital transformation in materials research
ジャーナル論文
著者
Jun Fujima (author) (この著者で検索)
National Institute for Materials Science Research Network and Facility Services Division/Materials Data Platform/Data Application Unit
ORCID SAMURAI ;
Hideki Yoshikawa (author) (この著者で検索)
National Institute for Materials Science Research Network and Facility Services Division/Materials Data Platform/Data Application Unit
ORCID SAMURAI ;
Hiroko Nagao (author) (この著者で検索)
National Institute for Materials Science Research Network and Facility Services Division/Materials Data Platform/Data Application Unit
;
Hiroaki Tosaka (author) (この著者で検索)
National Institute for Materials Science Research Network and Facility Services Division/Materials Data Platform/Data Infrastructure Unit
;
Takuya Kadohira (author) (この著者で検索)
National Institute for Materials Science Research Network and Facility Services Division/Materials Data Platform/Data Infrastructure Unit
ORCID SAMURAI ;
Masahiko Demura (author) (この著者で検索)
National Institute for Materials Science Research Network and Facility Services Division
ORCID SAMURAI
キーワード
materials informatics, data management system, digital transformation (DX), dataset Template, workflow automation
刊行年月日
2025-12-31
更新時刻
2025-12-19 16:30:40 +0900
HfO2-Fig12-Work-20230803.pdf
Raw data files for Fig. 12 Auger depth profiles in "Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam"
データセット
著者
OGIWARA, Toshiya (author) (この著者で検索)
National Institute for Materials Science
ORCID SAMURAI ;
NAGATA, Takahiro (author) (この著者で検索)
National Institute for Materials Science
ORCID SAMURAI ;
YOSHIKAWA, Hideki (author) (この著者で検索)
National Institute for Materials Science
ORCID SAMURAI
キーワード
Auger depth profiling analysis, HfO2/Si, Ultra low angle incidence ion beam
刊行年月日
2019-03-07
更新時刻
2024-01-05 22:13:20 +0900
HfO2-Fig11-Work-20230710.pdf
Raw data files for Fig. 11 Auger depth profiles in "Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam"
データセット
著者
OGIWARA, Toshiya (author) (この著者で検索)
National Institute for Materials Science
ORCID SAMURAI ;
NAGATA, Takahiro (author) (この著者で検索)
National Institute for Materials Science
ORCID SAMURAI ;
YOSHIKAWA, Hideki (author) (この著者で検索)
National Institute for Materials Science
ORCID SAMURAI
キーワード
Auger depth profiling analysis, HfO2/Si, Ultra low angle incidence ion beam
刊行年月日
2019-03-07
更新時刻
2024-04-07 22:57:41 +0900
HfO2-Fig10-Work-20230606.pdf
Raw data files for Fig. 10 Auger depth profiles in "Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam"
データセット
著者
OGIWARA, Toshiya (author) (この著者で検索)
National Institute for Materials Science
ORCID SAMURAI ;
NAGATA, Takahiro (author) (この著者で検索)
National Institute for Materials Science
ORCID SAMURAI ;
YOSHIKAWA, Hideki (author) (この著者で検索)
National Institute for Materials Science
ORCID SAMURAI
キーワード
Auger depth profiling analysis, HfO2/Si, Ultra low angle incidence ion beam
刊行年月日
2019-03-07
更新時刻
2024-01-05 22:12:41 +0900
HfO2-Fig9-Work-20230518.pdf
Raw data files for Fig. 9 Auger depth profiles in "Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam"
データセット
著者
OGIWARA, Toshiya (author) (この著者で検索)
National Institute for Materials Science
ORCID SAMURAI ;
NAGATA, Takahiro (author) (この著者で検索)
National Institute for Materials Science
ORCID SAMURAI ;
YOSHIKAWA, Hideki (author) (この著者で検索)
National Institute for Materials Science
ORCID SAMURAI
キーワード
Auger depth profiling analysis, HfO2/Si, Ultra low angle incidence ion beam
刊行年月日
2019-03-07
更新時刻
2024-10-08 12:20:27 +0900
HfO2-Fig5-Work-20230419.pdf
Raw data files for Fig. 5 Auger depth profiles in "Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam"
データセット
著者
OGIWARA, Toshiya (author) (この著者で検索)
National Institute for Materials Science
ORCID SAMURAI ;
NAGATA, Takahiro (author) (この著者で検索)
National Institute for Materials Science
ORCID SAMURAI ;
YOSHIKAWA, Hideki (author) (この著者で検索)
National Institute for Materials Science
ORCID SAMURAI
キーワード
Auger depth profiling analysis, HfO2/Si, Ultra low angle incidence ion beam
刊行年月日
2019-03-07
更新時刻
2024-03-30 18:50:38 +0900
HfO2-Fig6-Work-20230118.pdf
Raw data files for Fig. 6 Auger depth profiles in "Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam"
データセット
著者
OGIWARA, Toshiya (author) (この著者で検索)
National Institute for Materials Science
ORCID SAMURAI ;
NAGATA, Takahiro (author) (この著者で検索)
National Institute for Materials Science
ORCID SAMURAI ;
YOSHIKAWA, Hideki (author) (この著者で検索)
National Institute for Materials Science
ORCID SAMURAI
キーワード
Auger depth profiling analysis, HfO2/Si, Ultra low angle incidence ion beam
刊行年月日
2019-03-07
更新時刻
2024-03-30 18:50:25 +0900
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