Reference compositions for bismuth telluride thermoelectric materials for low-temperature power generation
- ジャーナル論文
- 著者
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;Nirma Kumari (author) (この著者で検索)Korea Electrotechnology Research Institute (KERI) a Energy Conversion Research Center, Electrical Materials Division;Jaywan Chung (author) (この著者で検索);Seunghyun Oh (author) (この著者で検索);Jeongin Jang (author) (この著者で検索);Jongho Park (author) (この著者で検索);Ji Hui Son (author) (この著者で検索);SuDong Park (author) (この著者で検索)Byungki Ryu (author) (この著者で検索)
- キーワード
- Reference composition, Thermoelectric, Bi0.46Sb1.54Te3, Bi2Te2.7Se0.3, BiTe system, Data-Driven
- 刊行年月日
- 2025-12-31
- 更新時刻
- 2025-11-13 08:30:20 +0900
Inhomogeneity-driven multiform Spontaneous Hall Effect in conventional and unconventional superconductors
- ジャーナル論文
- 著者
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;Nadia Stegani (author) (この著者で検索)a University of Genoa;Ilaria Pallecchi (author) (この著者で検索);Nicola Manca (author) (この著者で検索);Martina Meinero (author) (この著者で検索);Michela Iebole (author) (この著者で検索);Matteo Cialone (author) (この著者で検索);Valeria Braccini (author) (この著者で検索);Koushik Karmakar (author) (この著者で検索);Andrey Maljuk (author) (この著者で検索);Bernd Büchner (author) (この著者で検索);Vadim Grinenko (author) (この著者で検索);Marina Putti (author) (この著者で検索)Federico Caglieris (author) (この著者で検索)
- キーワード
- Inhomogeneities, superconductors, spontaneous hall effect, simulations
- 刊行年月日
- 2025-12-31
- 更新時刻
- 2025-08-22 16:30:24 +0900
Deep learning framework for analyzing birefringence imaging by incorporating optical polarization overlap in stress-induced ferroelectric SrTiO
- ジャーナル論文
- 著者
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;Hirotaka Manaka (author) (この著者で検索)Kagoshima University a Graduate School of Science and Engineering;Shoutarou Katayama (author) (この著者で検索);Soichiro Honda (author) (この著者で検索)Yoko Miura (author) (この著者で検索)
- キーワード
- LSTM, temperature series principal component analysis, 3D convolutional autoencoder, temperature series forest, stress-induced ferroelectricity, SrTiO3
- 刊行年月日
- 2025-12-31
- 更新時刻
- 2025-10-21 16:05:44 +0900
Thermal spin transport phenomena and their correlation to magnetic properties of metallic Pt/Co1-xFex and Pt/Ni1-xFex bilayers
- ジャーナル論文
- 著者
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;Panagiota Bougiatioti (author) (この著者で検索)Bielefeld University a Faculty of Physics;Orestis Manos (author) (この著者で検索);Günter Reiss (author) (この著者で検索)Timo Kuschel (author) (この著者で検索)
- キーワード
- Spin Seebeck effect, anomalous nernst effect, magnetic proximity effect
- 刊行年月日
- 2025-12-31
- 更新時刻
- 2025-12-05 16:30:09 +0900
PoLyInfo Conceptual Schema Version 1.1
- データセット
- コレクション
- PoLyInfo Knowledge Collection
- 著者
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Masashi Ishii (author) (この著者で検索)National Institute for Materials Science
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Koichi Sakamoto (author) (この著者で検索)National Institute for Materials Science - キーワード
- Polymer chemistry knowledge, PoLyInfo, Conceptual schema, ShEx, collection - PoLyInfo Knowledge
- 刊行年月日
- 更新時刻
- 2025-05-03 08:30:28 +0900
Raw data files for Fig. 12 Auger depth profiles in "Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam"
- データセット
- 著者
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OGIWARA, Toshiya (author) (この著者で検索)National Institute for Materials Science
;
NAGATA, Takahiro (author) (この著者で検索)National Institute for Materials Science
;
YOSHIKAWA, Hideki (author) (この著者で検索)National Institute for Materials Science
- キーワード
- Auger depth profiling analysis, HfO2/Si, Ultra low angle incidence ion beam
- 刊行年月日
- 2019-03-07
- 更新時刻
- 2024-01-05 22:13:20 +0900
Raw data files for Fig. 11 Auger depth profiles in "Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam"
- データセット
- 著者
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OGIWARA, Toshiya (author) (この著者で検索)National Institute for Materials Science
;
NAGATA, Takahiro (author) (この著者で検索)National Institute for Materials Science
;
YOSHIKAWA, Hideki (author) (この著者で検索)National Institute for Materials Science
- キーワード
- Auger depth profiling analysis, HfO2/Si, Ultra low angle incidence ion beam
- 刊行年月日
- 2019-03-07
- 更新時刻
- 2024-04-07 22:57:41 +0900
Raw data files for Fig. 10 Auger depth profiles in "Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam"
- データセット
- 著者
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OGIWARA, Toshiya (author) (この著者で検索)National Institute for Materials Science
;
NAGATA, Takahiro (author) (この著者で検索)National Institute for Materials Science
;
YOSHIKAWA, Hideki (author) (この著者で検索)National Institute for Materials Science
- キーワード
- Auger depth profiling analysis, HfO2/Si, Ultra low angle incidence ion beam
- 刊行年月日
- 2019-03-07
- 更新時刻
- 2024-01-05 22:12:41 +0900
Raw data files for Fig. 9 Auger depth profiles in "Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam"
- データセット
- 著者
-
OGIWARA, Toshiya (author) (この著者で検索)National Institute for Materials Science
;
NAGATA, Takahiro (author) (この著者で検索)National Institute for Materials Science
;
YOSHIKAWA, Hideki (author) (この著者で検索)National Institute for Materials Science
- キーワード
- Auger depth profiling analysis, HfO2/Si, Ultra low angle incidence ion beam
- 刊行年月日
- 2019-03-07
- 更新時刻
- 2024-10-08 12:20:27 +0900
Raw data files for Fig. 5 Auger depth profiles in "Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam"
- データセット
- 著者
-
OGIWARA, Toshiya (author) (この著者で検索)National Institute for Materials Science
;
NAGATA, Takahiro (author) (この著者で検索)National Institute for Materials Science
;
YOSHIKAWA, Hideki (author) (この著者で検索)National Institute for Materials Science
- キーワード
- Auger depth profiling analysis, HfO2/Si, Ultra low angle incidence ion beam
- 刊行年月日
- 2019-03-07
- 更新時刻
- 2024-03-30 18:50:38 +0900