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21 件のレコードが見つかりました。

データセット
Benchmark Dataset used in the paper "Fast Evaluation of Unbiased Atomic Forces in ab initio Variational Monte Carlo via the Lagrangian Technique"
データセット
著者
Kosuke Nakano (author) (この著者で検索)
National Institute for Materials Science (NIMS) Center for Basic Research on Materials (CBRM)
ORCID SAMURAI ;
Stefano Battaglia (author) (この著者で検索)
University of Zurich (UZH) Department of Chemistry
;
Jürg Hutter (author) (この著者で検索)
University of Zurich (UZH) Department of Chemistry
キーワード
Variational Monte Carlo, Atomic forces, rMD17
刊行年月日
更新時刻
2026-01-28 08:30:04 +0900
データセット
Electrical coherent driving of chiral antiferromagnet
データセット
著者
Yutaro Takeuchi (author) (この著者で検索)
National Institute for Materials Science (NIMS) Research Center for Magnetic and Spintronics Materials
;
Yuma Sato (author) (この著者で検索)
Tohoku University Laboratory for Nanoelectronics and Spintronics, Research Institute for Electrical Communication
;
Yuta Yamane (author) (この著者で検索)
Tohoku University Frontier Research Institute for Interdisciplinary Sciences
;
Ju-Young Yoon (author) (この著者で検索)
Tohoku University Laboratory for Nanoelectronics and Spintronics
;
Yukinori Kanno (author) (この著者で検索)
Tohoku University Laboratory for Nanoelectronics and Spintronics
;
Tomohiro Uchimura (author) (この著者で検索)
Tohoku University Laboratory for Nanoelectronics and Spintronics
;
K. Vihanga De Zoysa (author) (この著者で検索)
Tohoku University Laboratory for Nanoelectronics and Spintronics
;
Jiahao Han (author) (この著者で検索)
Tohoku University Advanced Institute for Materials Research
;
Shun Kanai (author) (この著者で検索)
Tohoku University Laboratory for Nanoelectronics and Spintronics
;
Jun’ichi Ieda (author) (この著者で検索)
Japan Atomic Energy Agency Advanced Science Research Center
;
Hideo Ohno (author) (この著者で検索)
Tohoku University Laboratory for Nanoelectronics and Spintronics
;
Shunsuke Fukami (author) (この著者で検索)
Tohoku University Laboratory for Nanoelectronics and Spintronics
キーワード
spintronics, antiferromagnet, switching
刊行年月日
2025-08-21
更新時刻
2025-09-10 16:46:49 +0900
TSTM-2025-0032.R1_graphical_abstract.pdf
Designing a Unified Data Structure for Solid-Electrolyte Research Projects
データセット
著者
Yasuhiro Fujiwara (author) (この著者で検索)
National Institute for Materials Science Research Network and Facility Services Division/Materials Data Platform/Data Application Unit
ORCID SAMURAI ;
Masahiko Demura (author) (この著者で検索)
National Institute for Materials Science Research Network and Facility Services Division
ORCID SAMURAI ;
Kazunori Takada (author) (この著者で検索)
National Institute for Materials Science Research Center for Energy and Environmental Materials (GREEN)/Battery and Cell Materials Field/Solid-State Battery Group
ORCID SAMURAI ;
Kota Suzuki (author) (この著者で検索)
Institute of Science Tokyo
;
Satoshi Hori (author) (この著者で検索)
Institute of Science Tokyo
;
Masaki Azuma (author) (この著者で検索)
Institute of Science Tokyo
;
Ryoji Kanno (author) (この著者で検索)
Institute of Science Tokyo
;
Yoshiyuki Inaguma (author) (この著者で検索)
Gakushuin University
;
Akitoshi Hayashi (author) (この著者で検索)
Osaka Metropolitan University
;
Yasutoshi Iriyama (author) (この著者で検索)
Graduate School of Engineering, Nagoya University
;
Hirotoshi Yamada (author) (この著者で検索)
Nagasaki University
;
Tetsuhiro Katsumata (author) (この著者で検索)
Tokai University
キーワード
process chain, data structure, data model, data management, Research Data Express, RDE, solid electrolytes
刊行年月日
2025-12-31
更新時刻
2025-12-19 08:30:30 +0900
HfO2-Fig12-Work-20230803.pdf
Raw data files for Fig. 12 Auger depth profiles in "Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam"
データセット
著者
OGIWARA, Toshiya (author) (この著者で検索)
National Institute for Materials Science
ORCID SAMURAI ;
NAGATA, Takahiro (author) (この著者で検索)
National Institute for Materials Science
ORCID SAMURAI ;
YOSHIKAWA, Hideki (author) (この著者で検索)
National Institute for Materials Science
ORCID SAMURAI
キーワード
Auger depth profiling analysis, HfO2/Si, Ultra low angle incidence ion beam
刊行年月日
2019-03-07
更新時刻
2024-01-05 22:13:20 +0900
HfO2-Fig11-Work-20230710.pdf
Raw data files for Fig. 11 Auger depth profiles in "Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam"
データセット
著者
OGIWARA, Toshiya (author) (この著者で検索)
National Institute for Materials Science
ORCID SAMURAI ;
NAGATA, Takahiro (author) (この著者で検索)
National Institute for Materials Science
ORCID SAMURAI ;
YOSHIKAWA, Hideki (author) (この著者で検索)
National Institute for Materials Science
ORCID SAMURAI
キーワード
Auger depth profiling analysis, HfO2/Si, Ultra low angle incidence ion beam
刊行年月日
2019-03-07
更新時刻
2024-04-07 22:57:41 +0900
HfO2-Fig10-Work-20230606.pdf
Raw data files for Fig. 10 Auger depth profiles in "Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam"
データセット
著者
OGIWARA, Toshiya (author) (この著者で検索)
National Institute for Materials Science
ORCID SAMURAI ;
NAGATA, Takahiro (author) (この著者で検索)
National Institute for Materials Science
ORCID SAMURAI ;
YOSHIKAWA, Hideki (author) (この著者で検索)
National Institute for Materials Science
ORCID SAMURAI
キーワード
Auger depth profiling analysis, HfO2/Si, Ultra low angle incidence ion beam
刊行年月日
2019-03-07
更新時刻
2024-01-05 22:12:41 +0900
HfO2-Fig9-Work-20230518.pdf
Raw data files for Fig. 9 Auger depth profiles in "Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam"
データセット
著者
OGIWARA, Toshiya (author) (この著者で検索)
National Institute for Materials Science
ORCID SAMURAI ;
NAGATA, Takahiro (author) (この著者で検索)
National Institute for Materials Science
ORCID SAMURAI ;
YOSHIKAWA, Hideki (author) (この著者で検索)
National Institute for Materials Science
ORCID SAMURAI
キーワード
Auger depth profiling analysis, HfO2/Si, Ultra low angle incidence ion beam
刊行年月日
2019-03-07
更新時刻
2024-10-08 12:20:27 +0900
HfO2-Fig5-Work-20230419.pdf
Raw data files for Fig. 5 Auger depth profiles in "Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam"
データセット
著者
OGIWARA, Toshiya (author) (この著者で検索)
National Institute for Materials Science
ORCID SAMURAI ;
NAGATA, Takahiro (author) (この著者で検索)
National Institute for Materials Science
ORCID SAMURAI ;
YOSHIKAWA, Hideki (author) (この著者で検索)
National Institute for Materials Science
ORCID SAMURAI
キーワード
Auger depth profiling analysis, HfO2/Si, Ultra low angle incidence ion beam
刊行年月日
2019-03-07
更新時刻
2024-03-30 18:50:38 +0900
HfO2-Fig6-Work-20230118.pdf
Raw data files for Fig. 6 Auger depth profiles in "Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam"
データセット
著者
OGIWARA, Toshiya (author) (この著者で検索)
National Institute for Materials Science
ORCID SAMURAI ;
NAGATA, Takahiro (author) (この著者で検索)
National Institute for Materials Science
ORCID SAMURAI ;
YOSHIKAWA, Hideki (author) (この著者で検索)
National Institute for Materials Science
ORCID SAMURAI
キーワード
Auger depth profiling analysis, HfO2/Si, Ultra low angle incidence ion beam
刊行年月日
2019-03-07
更新時刻
2024-03-30 18:50:25 +0900
HfO2-Fig7-Work-20221213.pdf
Raw data files for Fig. 7 Auger depth profiles in "Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam"
データセット
著者
OGIWARA, Toshiya (author) (この著者で検索)
National Institute for Materials Science
ORCID SAMURAI ;
NAGATA, Takahiro (author) (この著者で検索)
National Institute for Materials Science
ORCID SAMURAI ;
YOSHIKAWA, Hideki (author) (この著者で検索)
National Institute for Materials Science
ORCID SAMURAI
キーワード
Auger depth profiling analysis, HfO2/Si, Ultra low angle incidence ion beam
刊行年月日
2019-03-07
更新時刻
2024-01-05 22:12:25 +0900