MDRについて
ヘルプ
お問い合わせ
Switch language
日本語
English
ログイン
ログイン
Search MDR
Home
論文・データセット
コレクション
MDR HAXPES DB(3)
SuperCon Knowledge Collection(3)
MDR SuperCon Datasheet(2)
PoLyInfo Knowledge Collection(2)
MDR XAFS DB(1)
資源タイプ
ジャーナル論文(42)
データセット(25)
その他(1)
ソフトウェア(1)
キーワード
Auger depth profiling analysis (8)
HfO2/Si (8)
Ultra low angle incidence ion beam (8)
SuperCon (5)
Ontology (4)
RDF (4)
SPring-8 (4)
Superconductors (4)
BL46XU (3)
HAXPES (3)
(more)
ライセンス
Creative Commons BY Attribution 4.0 International (39)
In Copyright (13)
Creative Commons BY-NC Attribution-NonCommercial 4.0 International (7)
Creative Commons BY-NC-SA Attribution-NonCommercial-ShareAlike 4.0 International (4)
Creative Commons BY-ND Attribution-NoDerivatives 4.0 International (1)
http://creativecommons.org/publicdomain/zero/1.0/ (1)
ファイル種別
application/zip (69)
application/pdf (51)
text/plain (10)
application/octet-stream (6)
application/json (5)
image/png (4)
text/tab-separated-values (4)
text/csv (3)
text/markdown (3)
application/vnd.openxmlformats-officedocument.spreadsheetml.sheet (2)
計測法
X線光電子分光法 (1)
ファイル種別: application/zip
全ての絞り込みを解除
69 件のレコードが見つかりました。
Raw data files for Fig. 12 Auger depth profiles in "Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam"
データセット
著者
OGIWARA, Toshiya
(author) (
この著者で検索
)
https://orcid.org/0000-0002-7376-6571
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
OGIWARA, Toshiya
;
NAGATA, Takahiro
(author) (
この著者で検索
)
https://orcid.org/0000-0002-8591-2943
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
NAGATA, Takahiro
;
YOSHIKAWA, Hideki
(author) (
この著者で検索
)
https://orcid.org/0000-0002-7389-8865
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
YOSHIKAWA, Hideki
キーワード
Auger depth profiling analysis
,
HfO2/Si
,
Ultra low angle incidence ion beam
刊行年月日
2019-03-07
更新時刻
2024-01-05 22:13:20 +0900
Raw data files for Fig. 11 Auger depth profiles in "Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam"
データセット
著者
OGIWARA, Toshiya
(author) (
この著者で検索
)
https://orcid.org/0000-0002-7376-6571
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
OGIWARA, Toshiya
;
NAGATA, Takahiro
(author) (
この著者で検索
)
https://orcid.org/0000-0002-8591-2943
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
NAGATA, Takahiro
;
YOSHIKAWA, Hideki
(author) (
この著者で検索
)
https://orcid.org/0000-0002-7389-8865
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
YOSHIKAWA, Hideki
キーワード
Auger depth profiling analysis
,
HfO2/Si
,
Ultra low angle incidence ion beam
刊行年月日
2019-03-07
更新時刻
2024-04-07 22:57:41 +0900
Raw data files for Fig. 10 Auger depth profiles in "Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam"
データセット
著者
OGIWARA, Toshiya
(author) (
この著者で検索
)
https://orcid.org/0000-0002-7376-6571
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
OGIWARA, Toshiya
;
NAGATA, Takahiro
(author) (
この著者で検索
)
https://orcid.org/0000-0002-8591-2943
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
NAGATA, Takahiro
;
YOSHIKAWA, Hideki
(author) (
この著者で検索
)
https://orcid.org/0000-0002-7389-8865
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
YOSHIKAWA, Hideki
キーワード
Auger depth profiling analysis
,
HfO2/Si
,
Ultra low angle incidence ion beam
刊行年月日
2019-03-07
更新時刻
2024-01-05 22:12:41 +0900
Raw data files for Fig. 9 Auger depth profiles in "Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam"
データセット
著者
OGIWARA, Toshiya
(author) (
この著者で検索
)
https://orcid.org/0000-0002-7376-6571
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
OGIWARA, Toshiya
;
NAGATA, Takahiro
(author) (
この著者で検索
)
https://orcid.org/0000-0002-8591-2943
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
NAGATA, Takahiro
;
YOSHIKAWA, Hideki
(author) (
この著者で検索
)
https://orcid.org/0000-0002-7389-8865
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
YOSHIKAWA, Hideki
キーワード
Auger depth profiling analysis
,
HfO2/Si
,
Ultra low angle incidence ion beam
刊行年月日
2019-03-07
更新時刻
2024-10-08 12:20:27 +0900
Raw data files for Fig. 5 Auger depth profiles in "Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam"
データセット
著者
OGIWARA, Toshiya
(author) (
この著者で検索
)
https://orcid.org/0000-0002-7376-6571
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
OGIWARA, Toshiya
;
NAGATA, Takahiro
(author) (
この著者で検索
)
https://orcid.org/0000-0002-8591-2943
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
NAGATA, Takahiro
;
YOSHIKAWA, Hideki
(author) (
この著者で検索
)
https://orcid.org/0000-0002-7389-8865
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
YOSHIKAWA, Hideki
キーワード
Auger depth profiling analysis
,
HfO2/Si
,
Ultra low angle incidence ion beam
刊行年月日
2019-03-07
更新時刻
2024-03-30 18:50:38 +0900
Raw data files for Fig. 6 Auger depth profiles in "Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam"
データセット
著者
OGIWARA, Toshiya
(author) (
この著者で検索
)
https://orcid.org/0000-0002-7376-6571
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
OGIWARA, Toshiya
;
NAGATA, Takahiro
(author) (
この著者で検索
)
https://orcid.org/0000-0002-8591-2943
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
NAGATA, Takahiro
;
YOSHIKAWA, Hideki
(author) (
この著者で検索
)
https://orcid.org/0000-0002-7389-8865
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
YOSHIKAWA, Hideki
キーワード
Auger depth profiling analysis
,
HfO2/Si
,
Ultra low angle incidence ion beam
刊行年月日
2019-03-07
更新時刻
2024-03-30 18:50:25 +0900
Raw data files for Fig. 7 Auger depth profiles in "Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam"
データセット
著者
OGIWARA, Toshiya
(author) (
この著者で検索
)
https://orcid.org/0000-0002-7376-6571
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
OGIWARA, Toshiya
;
NAGATA, Takahiro
(author) (
この著者で検索
)
https://orcid.org/0000-0002-8591-2943
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
NAGATA, Takahiro
;
YOSHIKAWA, Hideki
(author) (
この著者で検索
)
https://orcid.org/0000-0002-7389-8865
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
YOSHIKAWA, Hideki
キーワード
Auger depth profiling analysis
,
HfO2/Si
,
Ultra low angle incidence ion beam
刊行年月日
2019-03-07
更新時刻
2024-01-05 22:12:25 +0900
Raw data files for Fig. 8 Auger depth profiles in "Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam"
データセット
著者
OGIWARA, Toshiya
(author) (
この著者で検索
)
https://orcid.org/0000-0002-7376-6571
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
OGIWARA, Toshiya
;
NAGATA, Takahiro
(author) (
この著者で検索
)
https://orcid.org/0000-0002-8591-2943
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
NAGATA, Takahiro
;
YOSHIKAWA, Hideki
(author) (
この著者で検索
)
https://orcid.org/0000-0002-7389-8865
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
YOSHIKAWA, Hideki
キーワード
Auger depth profiling analysis
,
HfO2/Si
,
Ultra low angle incidence ion beam
刊行年月日
2019-03-07
更新時刻
2024-01-05 22:11:29 +0900
Precipitative Coating of Calcium Phosphate on Microporous Silica–Titania Hybrid Particles in Simulated Body Fluid
ジャーナル論文
著者
Reo Kimura
(author) (
この著者で検索
)
Nagaoka University of Technology
Reo Kimura
;
Kota Shiba
(author) (
この著者で検索
)
https://orcid.org/0000-0001-7775-0318
National Institute for Materials Science Research Center for Macromolecules and Biomaterials/Biomaterials Field/Olfactory Sensors Group
NIMS Researchers Directory SAMURAI
Kota Shiba
;
Kanata Fujiwara
(author) (
この著者で検索
)
Nagaoka University of Technology
Kanata Fujiwara
;
Yanni Zhou
(author) (
この著者で検索
)
Nagaoka University of Technology
Yanni Zhou
;
Iori Yamada
(author) (
この著者で検索
)
Nagaoka University of Technology
Iori Yamada
;
Motohiro Tagaya
(author) (
この著者で検索
)
Nagaoka University of Technology
Motohiro Tagaya
キーワード
bioceramic nanoparticles
,
simulated body fluid
,
nanopore
,
CP precipitative coating
,
silica–titania nanohybrid
刊行年月日
2023-05-28
更新時刻
2024-11-20 18:40:02 +0900
Reproducible Chiroptical Activity from Aggregated Chiral Thienopyrroledione–Fluorene π‑Conjugated Polymers.
ジャーナル論文
著者
Nao Suzuki
(author) (
この著者で検索
)
University of Tsukuba a Institute of Pure and Applied Sciences
Nao Suzuki
;
Ziwei Hu
(author) (
この著者で検索
)
Ziwei Hu
;
Sota Nakayama
(author) (
この著者で検索
)
Sota Nakayama
;
Soh Kushida
(author) (
この著者で検索
)
Soh Kushida
;
Yohei Yamamoto
(author) (
この著者で検索
)
Yohei Yamamoto
;
Wijak Yospanya
(author) (
この著者で検索
)
Wijak Yospanya
;
Reiko Oda
(author) (
この著者で検索
)
Reiko Oda
;
Takaki Kanbara
(author) (
この著者で検索
)
Takaki Kanbara
;
Junpei Kuwabara
(author) (
この著者で検索
)
Junpei Kuwabara
キーワード
Chiral π‑conjugated polymer
,
thienopyrroledione
,
circular dichroism
,
circularly polarized luminescence
刊行年月日
2026-06-02
更新時刻
2026-06-19 13:05:19 +0900
キーワード
Auger depth profiling analysis
(8)
HfO2/Si
(8)
Ultra low angle incidence ion beam
(8)
SuperCon
(5)
Ontology
(4)
RDF
(4)
SPring-8
(4)
Superconductors
(4)
BL46XU
(3)
HAXPES
(3)
collection - MDR HAXPES DB
(3)
Conceptual schema
(2)
Metallic
(2)
Organic
(2)
Oxide
(2)
PoLyInfo
(2)
Polymer chemistry knowledge
(2)
Power Law
(2)
SPARQL
(2)
Semantic Web
(2)
ShEx
(2)
Tc
(2)
Thermoelectric
(2)
circularly polarized luminescence
(2)
collection - PoLyInfo Knowledge
(2)
machine learning
(2)
pulsed laser deposition
(2)
threshold
(2)
2D materials
(1)
3D convolutional autoencoder
(1)
AHE
(1)
Ag2Se
(1)
Anti-freezing electrolyte
(1)
Atomic forces
(1)
Automatic conversion
(1)
Automatic estimation methods
(1)
BERT
(1)
Bi0.46Sb1.54Te3
(1)
Bi2Te2.7Se0.3
(1)
Bi2Te3
(1)
BiTe system
(1)
Bulk photovoltaic effect
(1)
CFRP
(1)
CP precipitative coating
(1)
Charge Density Wave (CDW)
(1)
Charge perturbation
(1)
Chiral π‑conjugated polymer
(1)
Choline phosphate
(1)
Click chemistry
(1)
Composite
(1)
Contact angle hysteresis
(1)
Cross-database search
(1)
Cyclodextrin
(1)
Data-Driven
(1)
Debye model
(1)
Deep learning
(1)
Deep learning; Generative adversarial network; Inverse design; 3D shape; Microstructure; Mechanical metamaterial
(1)
Diamond
(1)
Electron Correlations
(1)
Electronic structure
(1)
Elinvar
(1)
Exciton Pseudospin
(1)
Fermiology
(1)
Ferrimagnet
(1)
Field effect
(1)
First-principles calculation
(1)
Fluorinated polymers
(1)
Ga2O3
(1)
GaN
(1)
Gallium nitride
(1)
Halide perovskite
(1)
Image data
(1)
Inhomogeneities
(1)
International XAFS DB portal
(1)
IoT
(1)
Iron-manganese based alloy
(1)
Kagome superconductor
(1)
Kondo insulators
(1)
LSTM
(1)
Liquid crystal
(1)
Liquid-crystal polymers
(1)
MOS structure
(1)
Machine learning
(1)
Metallocenes
(1)
Mn4N
(1)
MoS2
(1)
Molecule-responsive microgel
(1)
Motional Narrowing
(1)
Mott insulators
(1)
Multilayer graphene
(1)
Mössbauer spectroscopy
(1)
Neuromorphic
(1)
Non-noble metal
(1)
Numerical data
(1)
Oxidation
(1)
Photoelectron Yield Spectroscopy:
(1)
Plot with multiple line
(1)
Polarization Contrast
(1)
Post-polymerization functionalization
(1)
Protein design
(1)
Pt Sputtered
(1)
Pt_Sputtered
(1)
Quantum Spin Hall (QSH) Insulator
(1)
RAFT polymerization
(1)
RDE
(1)
RNA-seq
(1)
Reference composition
(1)
Research Data Express
(1)
Sections
(1)
Semantic web
(1)
Semantics
(1)
Silver nanowire network
(1)
Solar cells
(1)
Sommerfeld model
(1)
Spin Seebeck effect
(1)
Spin perturbation
(1)
SrTiO3
(1)
SrTiO₃
(1)
Sticky hydrophobic surface
(1)
Strongly correlated systems
(1)
Super conductor
(1)
Supercapacitor
(1)
Surface oxidation
(1)
TDA
(1)
TMAH
(1)
Terminology
(1)
Thermoelectric cooling
(1)
Titanium alloys
(1)
Transistor
(1)
Valley Decoherence
(1)
Variational Monte Carlo
(1)
Water-soluble emulsifier
(1)
Word
(1)
X-ray CT
(1)
XAFS
(1)
XAS
(1)
XMCD
(1)
XML
(1)
XPS
(1)
Young’s modulus prediction
(1)
Zn
(1)
Zn anode
(1)
Zr
(1)
aging
(1)
anode
(1)
anomalous nernst effect
(1)
appendices
(1)
bio-composite
(1)
bioceramic nanoparticles
(1)
biological sex
(1)
biomedical alloys
(1)
carbon electrode
(1)
catalyst poisoning
(1)
circular dichroism
(1)
collection - MDR XAFS DB
(1)
compositional homogeneity
(1)
crack, persistent homology
(1)
cycle stability
(1)
data management
(1)
data management system
(1)
data model
(1)
data structure
(1)
data visualization
(1)
dataset Template
(1)
dendrite-free
(1)
density functional theory
(1)
digital transformation (DX)
(1)
dissociative H2 adsorption
(1)
electric double-layer
(1)
electrochemical impedance
(1)
emergent dynamics
(1)
eringi
(1)
ferroelectric
(1)
ferroelectric liquid crystal
(1)
fiber positions
(1)
figures
(1)
fonts
(1)
free software
(1)
generative AI
(1)
high H2 pressure
(1)
high entropy alloy
(1)
high pressure
(1)
high pressure in situ measurement
(1)
high pressure synthesis
(1)
high-throughput virtual screening
(1)
hydrogel
(1)
hydrogen electron-doped graphene
(1)
inclusion complex
(1)
informatics
(1)
inverse miniemulsion polymerization
(1)
kanpyo
(1)
lactate
(1)
laser-heated diamond-anvil cell
(1)
learning
(1)
light emitting diode
(1)
liquid crystalline semiconductor
(1)
lists
(1)
literal information
(1)
local distortion
(1)
machine extraction
(1)
RDEメタデータ定義
RDE送り状
<
1
2
3
4
5
6
7
>