メニュー
MDRについて
ヘルプ
お問い合わせ
Switch language
日本語
English
ログイン
ログイン
Search MDR
Home
論文・データセット
コレクション
資源タイプ
ジャーナル論文(27)
データセット(11)
キーワード
Auger depth profiling analysis (8)
HfO2/Si (8)
Ultra low angle incidence ion beam (8)
Thermoelectric (2)
circularly polarized luminescence (2)
3D convolutional autoencoder (1)
AHE (1)
Anti-freezing electrolyte (1)
Atomic Force Microscope (1)
BERT (1)
(more)
ライセンス
Creative Commons BY Attribution 4.0 International (24)
In Copyright (9)
Creative Commons BY-NC Attribution-NonCommercial 4.0 International (3)
Creative Commons BY-ND Attribution-NoDerivatives 4.0 International (1)
ファイル種別
application/zip (38)
application/pdf (34)
application/vnd.openxmlformats-officedocument.spreadsheetml.sheet (1)
image/jpeg (1)
text/markdown (1)
計測法
X線光電子分光法 (1)
装置名
BL23_XPS (1)
装置型番
(1)
ファイル種別: application/zip
全ての絞り込みを解除
38 件のレコードが見つかりました。 1件目から10件目まで表示します。
全ての絞り込みを解除
Raw data files for Fig. 12 Auger depth profiles in "Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam"
データセット
著者
OGIWARA, Toshiya
(author) (
この著者で検索
)
https://orcid.org/0000-0002-7376-6571
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
OGIWARA, Toshiya
;
NAGATA, Takahiro
(author) (
この著者で検索
)
https://orcid.org/0000-0002-8591-2943
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
NAGATA, Takahiro
;
YOSHIKAWA, Hideki
(author) (
この著者で検索
)
https://orcid.org/0000-0002-7389-8865
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
YOSHIKAWA, Hideki
キーワード
Auger depth profiling analysis
,
HfO2/Si
,
Ultra low angle incidence ion beam
刊行年月日
2019-03-07
更新時刻
2024-01-05 22:13:20 +0900
Raw data files for Fig. 11 Auger depth profiles in "Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam"
データセット
著者
OGIWARA, Toshiya
(author) (
この著者で検索
)
https://orcid.org/0000-0002-7376-6571
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
OGIWARA, Toshiya
;
NAGATA, Takahiro
(author) (
この著者で検索
)
https://orcid.org/0000-0002-8591-2943
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
NAGATA, Takahiro
;
YOSHIKAWA, Hideki
(author) (
この著者で検索
)
https://orcid.org/0000-0002-7389-8865
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
YOSHIKAWA, Hideki
キーワード
Auger depth profiling analysis
,
HfO2/Si
,
Ultra low angle incidence ion beam
刊行年月日
2019-03-07
更新時刻
2024-04-07 22:57:41 +0900
Raw data files for Fig. 10 Auger depth profiles in "Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam"
データセット
著者
OGIWARA, Toshiya
(author) (
この著者で検索
)
https://orcid.org/0000-0002-7376-6571
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
OGIWARA, Toshiya
;
NAGATA, Takahiro
(author) (
この著者で検索
)
https://orcid.org/0000-0002-8591-2943
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
NAGATA, Takahiro
;
YOSHIKAWA, Hideki
(author) (
この著者で検索
)
https://orcid.org/0000-0002-7389-8865
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
YOSHIKAWA, Hideki
キーワード
Auger depth profiling analysis
,
HfO2/Si
,
Ultra low angle incidence ion beam
刊行年月日
2019-03-07
更新時刻
2024-01-05 22:12:41 +0900
Raw data files for Fig. 9 Auger depth profiles in "Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam"
データセット
著者
OGIWARA, Toshiya
(author) (
この著者で検索
)
https://orcid.org/0000-0002-7376-6571
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
OGIWARA, Toshiya
;
NAGATA, Takahiro
(author) (
この著者で検索
)
https://orcid.org/0000-0002-8591-2943
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
NAGATA, Takahiro
;
YOSHIKAWA, Hideki
(author) (
この著者で検索
)
https://orcid.org/0000-0002-7389-8865
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
YOSHIKAWA, Hideki
キーワード
Auger depth profiling analysis
,
HfO2/Si
,
Ultra low angle incidence ion beam
刊行年月日
2019-03-07
更新時刻
2024-10-08 12:20:27 +0900
Raw data files for Fig. 5 Auger depth profiles in "Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam"
データセット
著者
OGIWARA, Toshiya
(author) (
この著者で検索
)
https://orcid.org/0000-0002-7376-6571
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
OGIWARA, Toshiya
;
NAGATA, Takahiro
(author) (
この著者で検索
)
https://orcid.org/0000-0002-8591-2943
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
NAGATA, Takahiro
;
YOSHIKAWA, Hideki
(author) (
この著者で検索
)
https://orcid.org/0000-0002-7389-8865
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
YOSHIKAWA, Hideki
キーワード
Auger depth profiling analysis
,
HfO2/Si
,
Ultra low angle incidence ion beam
刊行年月日
2019-03-07
更新時刻
2024-03-30 18:50:38 +0900
Raw data files for Fig. 6 Auger depth profiles in "Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam"
データセット
著者
OGIWARA, Toshiya
(author) (
この著者で検索
)
https://orcid.org/0000-0002-7376-6571
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
OGIWARA, Toshiya
;
NAGATA, Takahiro
(author) (
この著者で検索
)
https://orcid.org/0000-0002-8591-2943
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
NAGATA, Takahiro
;
YOSHIKAWA, Hideki
(author) (
この著者で検索
)
https://orcid.org/0000-0002-7389-8865
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
YOSHIKAWA, Hideki
キーワード
Auger depth profiling analysis
,
HfO2/Si
,
Ultra low angle incidence ion beam
刊行年月日
2019-03-07
更新時刻
2024-03-30 18:50:25 +0900
Raw data files for Fig. 7 Auger depth profiles in "Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam"
データセット
著者
OGIWARA, Toshiya
(author) (
この著者で検索
)
https://orcid.org/0000-0002-7376-6571
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
OGIWARA, Toshiya
;
NAGATA, Takahiro
(author) (
この著者で検索
)
https://orcid.org/0000-0002-8591-2943
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
NAGATA, Takahiro
;
YOSHIKAWA, Hideki
(author) (
この著者で検索
)
https://orcid.org/0000-0002-7389-8865
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
YOSHIKAWA, Hideki
キーワード
Auger depth profiling analysis
,
HfO2/Si
,
Ultra low angle incidence ion beam
刊行年月日
2019-03-07
更新時刻
2024-01-05 22:12:25 +0900
Raw data files for Fig. 8 Auger depth profiles in "Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam"
データセット
著者
OGIWARA, Toshiya
(author) (
この著者で検索
)
https://orcid.org/0000-0002-7376-6571
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
OGIWARA, Toshiya
;
NAGATA, Takahiro
(author) (
この著者で検索
)
https://orcid.org/0000-0002-8591-2943
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
NAGATA, Takahiro
;
YOSHIKAWA, Hideki
(author) (
この著者で検索
)
https://orcid.org/0000-0002-7389-8865
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
YOSHIKAWA, Hideki
キーワード
Auger depth profiling analysis
,
HfO2/Si
,
Ultra low angle incidence ion beam
刊行年月日
2019-03-07
更新時刻
2024-01-05 22:11:29 +0900
Orthogonal spectroscopic assessment of higher-order structure of nucleic acids and its concentration-dependent polymorphism
データセット
著者
Taiji Oyama
(author) (
この著者で検索
)
JASCO Corporation
Taiji Oyama
;
Satoko Suzuki
(author) (
この著者で検索
)
JASCO Corporation
Satoko Suzuki
;
Ken-ichi Akaoa
(author) (
この著者で検索
)
JASCO Corporation
Ken-ichi Akaoa
;
Kazunori Ikebukurob
(author) (
この著者で検索
)
Tokyo University of Agriculture and Technology
Kazunori Ikebukurob
;
Kohsaku Kawakami
(author) (
この著者で検索
)
https://orcid.org/0000-0002-3466-9365
National Institute for Materials Science External Collaboration Division/Materials Open Platform for Pharmaceutical Science
NIMS Researchers Directory SAMURAI
Kohsaku Kawakami
;
Tomohiko Yamazaki
(author) (
この著者で検索
)
https://orcid.org/0000-0003-2136-8042
National Institute for Materials Science Research Center for Macromolecules and Biomaterials/Biomaterials Field/Medical Soft Matter Group
NIMS Researchers Directory SAMURAI
Tomohiko Yamazaki
キーワード
Circular Dichroism spectrum
,
Raman spectrum
,
Fourier Transform Infrared spectrum
,
Fluorescence spctrum
,
Atomic Force Microscope
刊行年月日
更新時刻
2026-08-27 15:52:20 +0900
Precipitative Coating of Calcium Phosphate on Microporous Silica–Titania Hybrid Particles in Simulated Body Fluid
ジャーナル論文
著者
Reo Kimura
(author) (
この著者で検索
)
Nagaoka University of Technology
Reo Kimura
;
Kota Shiba
(author) (
この著者で検索
)
https://orcid.org/0000-0001-7775-0318
National Institute for Materials Science Research Center for Macromolecules and Biomaterials/Biomaterials Field/Olfactory Sensors Group
NIMS Researchers Directory SAMURAI
Kota Shiba
;
Kanata Fujiwara
(author) (
この著者で検索
)
Nagaoka University of Technology
Kanata Fujiwara
;
Yanni Zhou
(author) (
この著者で検索
)
Nagaoka University of Technology
Yanni Zhou
;
Iori Yamada
(author) (
この著者で検索
)
Nagaoka University of Technology
Iori Yamada
;
Motohiro Tagaya
(author) (
この著者で検索
)
Nagaoka University of Technology
Motohiro Tagaya
キーワード
bioceramic nanoparticles
,
simulated body fluid
,
nanopore
,
CP precipitative coating
,
silica–titania nanohybrid
刊行年月日
2023-05-28
更新時刻
2024-11-20 18:40:02 +0900
キーワード
Auger depth profiling analysis
(8)
HfO2/Si
(8)
Ultra low angle incidence ion beam
(8)
Thermoelectric
(2)
circularly polarized luminescence
(2)
3D convolutional autoencoder
(1)
AHE
(1)
Anti-freezing electrolyte
(1)
Atomic Force Microscope
(1)
BERT
(1)
Bi0.46Sb1.54Te3
(1)
Bi2Te2.7Se0.3
(1)
BiTe system
(1)
Bulk photovoltaic effect
(1)
CFRP
(1)
CP precipitative coating
(1)
Charge Density Wave (CDW)
(1)
Charge perturbation
(1)
Chiral π‑conjugated polymer
(1)
Choline phosphate
(1)
Circular Dichroism spectrum
(1)
Composite
(1)
Cyclodextrin
(1)
Data-Driven
(1)
Debye model
(1)
Electron Correlations
(1)
Electronic structure
(1)
Elinvar
(1)
Fermiology
(1)
Ferrimagnet
(1)
First-principles calculation
(1)
Fluorescence spctrum
(1)
Fourier Transform Infrared spectrum
(1)
Ga2O3
(1)
GaN
(1)
Gallium nitride
(1)
Halide perovskite
(1)
IoT
(1)
Iron-manganese based alloy
(1)
Kagome superconductor
(1)
Kondo insulators
(1)
LSTM
(1)
Liquid crystal
(1)
MOS structure
(1)
Machine learning
(1)
Metallocenes
(1)
Mn4N
(1)
Molecule-responsive microgel
(1)
Mott insulators
(1)
Mössbauer spectroscopy
(1)
Oxidation
(1)
Protein design
(1)
Quantum Spin Hall (QSH) Insulator
(1)
RAFT polymerization
(1)
RNA-seq
(1)
Raman spectrum
(1)
Reference composition
(1)
SPring-8
(1)
Sections
(1)
Solar cells
(1)
Sommerfeld model
(1)
Spin perturbation
(1)
SrTiO3
(1)
SrTiO₃
(1)
Strongly correlated systems
(1)
Supercapacitor
(1)
Surface oxidation
(1)
TDA
(1)
TMAH
(1)
Titanium alloys
(1)
Water-soluble emulsifier
(1)
Word
(1)
X-ray CT
(1)
XAS
(1)
XMCD
(1)
XPS
(1)
Young’s modulus prediction
(1)
Zn anode
(1)
aging
(1)
appendices
(1)
bio-composite
(1)
bioceramic nanoparticles
(1)
biological sex
(1)
biomedical alloys
(1)
carbon electrode
(1)
circular dichroism
(1)
crack, persistent homology
(1)
cycle stability
(1)
dendrite-free
(1)
density functional theory
(1)
electric double-layer
(1)
eringi
(1)
ferroelectric
(1)
ferroelectric liquid crystal
(1)
fiber positions
(1)
figures
(1)
fonts
(1)
generative AI
(1)
high pressure
(1)
high pressure in situ measurement
(1)
high pressure synthesis
(1)
high-throughput virtual screening
(1)
hydrogel
(1)
inclusion complex
(1)
inverse miniemulsion polymerization
(1)
kanpyo
(1)
lactate
(1)
laser-heated diamond-anvil cell
(1)
light emitting diode
(1)
liquid crystalline semiconductor
(1)
lists
(1)
literal information
(1)
local distortion
(1)
machine learning
(1)
macrophages
(1)
magnetic compensation
(1)
martensitic transformation
(1)
mathematics
(1)
melting point
(1)
metal-air batteries
(1)
metallic electrode
(1)
micro-thermoelectric generator
(1)
microspheres
(1)
mobility spectrum analysis
(1)
multi-objective optimization
(1)
nanomedicines
(1)
nanopore
(1)
non-monotonic Hall effect
(1)
oligothiophene
(1)
phonon softening
(1)
plasma emission spectrum
(1)
pre-training
(1)
principal component analysis (PCA)
(1)
pulsed laser deposition
(1)
quantum oscillations
(1)
quasi-harmonic vibrational contribution
(1)
reactive magnetron sputtering
(1)
references
(1)
reinforcement
(1)
silica–titania nanohybrid
(1)
simulated body fluid
(1)
stress-induced ferroelectricity
(1)
structural design
(1)
surface modification
(1)
tables
(1)
temperature series forest
(1)
temperature series principal component analysis
(1)
thienopyrroledione
(1)
thin-films
(1)
time resolved microwave conductivity
(1)
time resolved photoluminescence
(1)
titanium alloys
(1)
uptake
(1)
wet etching
(1)
word embedding
(1)
work function
(1)
zwitterionic polymer
(1)
RDEメタデータ定義
RDE送り状
<
1
2
3
4
>
絞り込み
コレクション
資源タイプ
ジャーナル論文(27)
データセット(11)
キーワード
Auger depth profiling analysis (8)
HfO2/Si (8)
Ultra low angle incidence ion beam (8)
Thermoelectric (2)
circularly polarized luminescence (2)
3D convolutional autoencoder (1)
AHE (1)
Anti-freezing electrolyte (1)
Atomic Force Microscope (1)
BERT (1)
(more)
ライセンス
Creative Commons BY Attribution 4.0 International (24)
In Copyright (9)
Creative Commons BY-NC Attribution-NonCommercial 4.0 International (3)
Creative Commons BY-ND Attribution-NoDerivatives 4.0 International (1)
ファイル種別
application/zip (38)
application/pdf (34)
application/vnd.openxmlformats-officedocument.spreadsheetml.sheet (1)
image/jpeg (1)
text/markdown (1)
計測法
X線光電子分光法 (1)
装置名
BL23_XPS (1)
装置型番
(1)