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79 件のレコードが見つかりました。
Raw data files for Fig. 10 Auger depth profiles in "Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam"
データセット
著者
OGIWARA, Toshiya
(author) (
この著者で検索
)
https://orcid.org/0000-0002-7376-6571
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
OGIWARA, Toshiya
;
NAGATA, Takahiro
(author) (
この著者で検索
)
https://orcid.org/0000-0002-8591-2943
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
NAGATA, Takahiro
;
YOSHIKAWA, Hideki
(author) (
この著者で検索
)
https://orcid.org/0000-0002-7389-8865
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
YOSHIKAWA, Hideki
キーワード
Auger depth profiling analysis
,
HfO2/Si
,
Ultra low angle incidence ion beam
刊行年月日
2019-03-07
更新時刻
2024-01-05 22:12:41 +0900
Raw data files for Fig. 9 Auger depth profiles in "Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam"
データセット
著者
OGIWARA, Toshiya
(author) (
この著者で検索
)
https://orcid.org/0000-0002-7376-6571
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
OGIWARA, Toshiya
;
NAGATA, Takahiro
(author) (
この著者で検索
)
https://orcid.org/0000-0002-8591-2943
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
NAGATA, Takahiro
;
YOSHIKAWA, Hideki
(author) (
この著者で検索
)
https://orcid.org/0000-0002-7389-8865
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
YOSHIKAWA, Hideki
キーワード
Auger depth profiling analysis
,
HfO2/Si
,
Ultra low angle incidence ion beam
刊行年月日
2019-03-07
更新時刻
2024-10-08 12:20:27 +0900
Raw data files for Fig. 5 Auger depth profiles in "Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam"
データセット
著者
OGIWARA, Toshiya
(author) (
この著者で検索
)
https://orcid.org/0000-0002-7376-6571
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
OGIWARA, Toshiya
;
NAGATA, Takahiro
(author) (
この著者で検索
)
https://orcid.org/0000-0002-8591-2943
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
NAGATA, Takahiro
;
YOSHIKAWA, Hideki
(author) (
この著者で検索
)
https://orcid.org/0000-0002-7389-8865
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
YOSHIKAWA, Hideki
キーワード
Auger depth profiling analysis
,
HfO2/Si
,
Ultra low angle incidence ion beam
刊行年月日
2019-03-07
更新時刻
2024-03-30 18:50:38 +0900
Raw data files for Fig. 6 Auger depth profiles in "Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam"
データセット
著者
OGIWARA, Toshiya
(author) (
この著者で検索
)
https://orcid.org/0000-0002-7376-6571
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
OGIWARA, Toshiya
;
NAGATA, Takahiro
(author) (
この著者で検索
)
https://orcid.org/0000-0002-8591-2943
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
NAGATA, Takahiro
;
YOSHIKAWA, Hideki
(author) (
この著者で検索
)
https://orcid.org/0000-0002-7389-8865
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
YOSHIKAWA, Hideki
キーワード
Auger depth profiling analysis
,
HfO2/Si
,
Ultra low angle incidence ion beam
刊行年月日
2019-03-07
更新時刻
2024-03-30 18:50:25 +0900
Raw data files for Fig. 7 Auger depth profiles in "Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam"
データセット
著者
OGIWARA, Toshiya
(author) (
この著者で検索
)
https://orcid.org/0000-0002-7376-6571
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
OGIWARA, Toshiya
;
NAGATA, Takahiro
(author) (
この著者で検索
)
https://orcid.org/0000-0002-8591-2943
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
NAGATA, Takahiro
;
YOSHIKAWA, Hideki
(author) (
この著者で検索
)
https://orcid.org/0000-0002-7389-8865
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
YOSHIKAWA, Hideki
キーワード
Auger depth profiling analysis
,
HfO2/Si
,
Ultra low angle incidence ion beam
刊行年月日
2019-03-07
更新時刻
2024-01-05 22:12:25 +0900
Raw data files for Fig. 8 Auger depth profiles in "Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam"
データセット
著者
OGIWARA, Toshiya
(author) (
この著者で検索
)
https://orcid.org/0000-0002-7376-6571
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
OGIWARA, Toshiya
;
NAGATA, Takahiro
(author) (
この著者で検索
)
https://orcid.org/0000-0002-8591-2943
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
NAGATA, Takahiro
;
YOSHIKAWA, Hideki
(author) (
この著者で検索
)
https://orcid.org/0000-0002-7389-8865
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
YOSHIKAWA, Hideki
キーワード
Auger depth profiling analysis
,
HfO2/Si
,
Ultra low angle incidence ion beam
刊行年月日
2019-03-07
更新時刻
2024-01-05 22:11:29 +0900
Phonon Anomaly and Local Distortion in Iron-Manganese-Based Elinvar Alloys
ジャーナル論文
著者
Yoshihiko Umemoto
(author) (
この著者で検索
)
Tohoku University Institute for Materials Research
Yoshihiko Umemoto
;
Yoichi Ikeda
(author) (
この著者で検索
)
Yoichi Ikeda
;
Takashi Honda
(author) (
この著者で検索
)
Takashi Honda
;
Daisuke Ishikawa
(author) (
この著者で検索
)
Daisuke Ishikawa
;
John A. Schneeloch
(author) (
この著者で検索
)
John A. Schneeloch
;
Jörg C. Neuefeind
(author) (
この著者で検索
)
Jörg C. Neuefeind
;
Shinichiro Tozawa
(author) (
この著者で検索
)
Shinichiro Tozawa
;
Rie Umetsu
(author) (
この著者で検索
)
Rie Umetsu
;
Despina Louca
(author) (
この著者で検索
)
Despina Louca
;
Alfred Q.R. Baron
(author) (
この著者で検索
)
Alfred Q.R. Baron
;
Masaki Fujita
(author) (
この著者で検索
)
Masaki Fujita
キーワード
Iron-manganese based alloy
,
Elinvar
,
martensitic transformation
,
phonon softening
,
local distortion
刊行年月日
2025-12-31
更新時刻
2025-08-06 08:30:28 +0900
A novel approach to micro-fabricated thermoelectric generators with SrTiO3
ジャーナル論文
著者
Joaquin Santandera
(author) (
この著者で検索
)
a Institute of Microelectronics of Barcelona (IMB-CNM-CSIC)
Joaquin Santandera
;
Iñigo Martin-Fernandez
(author) (
この著者で検索
)
Iñigo Martin-Fernandez
;
Carlos Carbonell
(author) (
この著者で検索
)
Carlos Carbonell
;
Alex Rodríguez-Iglesias
(author) (
この著者で検索
)
Alex Rodríguez-Iglesias
;
Laura Fuentes-Rodríguez
(author) (
この著者で検索
)
Laura Fuentes-Rodríguez
;
Marta Fernández-Regúlez
(author) (
この著者で検索
)
Marta Fernández-Regúlez
;
Llibertat Abad
(author) (
この著者で検索
)
Llibertat Abad
;
Aitor F. Lopeandia
(author) (
この著者で検索
)
Aitor F. Lopeandia
;
Arindom Chatterjee
(author) (
この著者で検索
)
Arindom Chatterjee
;
Nini Pryds
(author) (
この著者で検索
)
Nini Pryds
;
Luis Fonseca
(author) (
この著者で検索
)
Luis Fonseca
;
Marc Salleras
(author) (
この著者で検索
)
Marc Salleras
キーワード
Thermoelectric
,
micro-thermoelectric generator
,
thin-films
,
SrTiO₃
,
IoT
刊行年月日
2026-05-08
更新時刻
2026-05-21 11:58:16 +0900
Free Analysis and Visualization Programs for Electrochemical Impedance Spectroscopy Coded in Python
ジャーナル論文
著者
KOBAYASHI, Kiyoshi
(author) (
この著者で検索
)
https://orcid.org/0000-0001-9644-1879
NIMS Researchers Directory SAMURAI
KOBAYASHI, Kiyoshi
;
SUZUKI, Tohru S.
(author) (
この著者で検索
)
SUZUKI, Tohru S.
キーワード
model fitting
,
free software
,
electrochemical impedance
,
data visualization
刊行年月日
2021-03-05
更新時刻
2024-01-05 22:11:18 +0900
Towards the practical realization of high-performance Ag2Se-based thermoelectric coolers
ジャーナル論文
著者
Feng Jiang
(author) (
この著者で検索
)
Harbin Institute of Technology Shenzhen a School of Materials Science and Engineering
Feng Jiang
;
Zhengtao Wanga
(author) (
この著者で検索
)
Zhengtao Wanga
;
Wen Zhonga
(author) (
この著者で検索
)
Wen Zhonga
;
Yifan Zhoua
(author) (
この著者で検索
)
Yifan Zhoua
;
Zhengyang Zhou
(author) (
この著者で検索
)
Zhengyang Zhou
;
Longzhi Wu
(author) (
この著者で検索
)
Longzhi Wu
;
Jiang Chen
(author) (
この著者で検索
)
Jiang Chen
;
Yao Xua
(author) (
この著者で検索
)
Yao Xua
;
Xiaodong Wang
(author) (
この著者で検索
)
Xiaodong Wang
;
Feng Cao
(author) (
この著者で検索
)
Feng Cao
;
Qian Zhang
(author) (
この著者で検索
)
Qian Zhang
;
Jun Mao
(author) (
この著者で検索
)
Jun Mao
キーワード
Thermoelectric cooling
,
Ag2Se
,
compositional homogeneity
刊行年月日
2026-03-12
更新時刻
2026-03-23 15:18:46 +0900
キーワード
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RDEメタデータ定義
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