14 件のレコードが見つかりました。
Dual quantum spin Hall insulator by density-tuned correlations in TaIrTe4
- 論文
- 著者
-
Jian Tang
;
Thomas Siyuan Ding
;
Hongyu Chen
;
Anyuan Gao
;
Tiema Qian
;
Zumeng Huang
;
Zhe Sun
;
Xin Han
;
Alex Strasser
;
Jiangxu Li
;
Michael Geiwitz
;
Mohamed Shehabeldin
;
Vsevolod Belosevich
;
Zihan Wang
;
Yiping Wang
;
Kenji Watanabe
;
Takashi Taniguchi
;
David C. Bell
;
Ziqiang Wang
;
Liang Fu
;
Yang Zhang
;
Xiaofeng Qian
;
Kenneth S. Burch
;
Youguo Shi
;
Ni Ni
;
Guoqing Chang
;
Su-Yang Xu
;
Qiong Ma
- キーワード
- Quantum Spin Hall (QSH) Insulator, Electron Correlations, Charge Density Wave (CDW)
- 刊行年月日
- 2024-04-18
- 更新時刻
- 2025-09-05 16:30:37 +0900
Motion of Two-Dimensional Excitons in Momentum Space Leads to Pseudospin Distribution Narrowing on the Bloch Sphere
- 論文
- 著者
-
Garima Gupta
;
Kenji Watanabe
;
Takashi Taniguchi
;
Kausik Majumdar
- キーワード
- 2D materials, Exciton Pseudospin, Valley Decoherence, Motional Narrowing, Polarization Contrast, MoS2
- 刊行年月日
- 2024-05-08
- 更新時刻
- 2025-07-29 12:30:27 +0900
Preprocessing Method for Spectra Interpreted by the Power Law Using Segment Regression
- 論文
- 著者
-
Shinjiro Yagyu
;
Michiko Yoshitake
;
Takahiro Nagata
- キーワード
- Power Law , Photoelectron Yield Spectroscopy:, segment regression
- 刊行年月日
- 2024-11-26
- 更新時刻
- 2024-12-04 14:52:47 +0900
Raw data files for Fig. 12 Auger depth profiles in "Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam"
- データセット
- 著者
-
OGIWARA, Toshiya
;
NAGATA, Takahiro
;
YOSHIKAWA, Hideki
- キーワード
- Auger depth profiling analysis, HfO2/Si, Ultra low angle incidence ion beam
- 刊行年月日
- 2019-03-07
- 更新時刻
- 2024-01-05 22:13:20 +0900
Raw data files for Fig. 11 Auger depth profiles in "Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam"
- データセット
- 著者
-
OGIWARA, Toshiya
;
NAGATA, Takahiro
;
YOSHIKAWA, Hideki
- キーワード
- Auger depth profiling analysis, HfO2/Si, Ultra low angle incidence ion beam
- 刊行年月日
- 2019-03-07
- 更新時刻
- 2024-04-07 22:57:41 +0900
Raw data files for Fig. 10 Auger depth profiles in "Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam"
- データセット
- 著者
-
OGIWARA, Toshiya
;
NAGATA, Takahiro
;
YOSHIKAWA, Hideki
- キーワード
- Auger depth profiling analysis, HfO2/Si, Ultra low angle incidence ion beam
- 刊行年月日
- 2019-03-07
- 更新時刻
- 2024-01-05 22:12:41 +0900
Raw data files for Fig. 9 Auger depth profiles in "Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam"
- データセット
- 著者
-
OGIWARA, Toshiya
;
NAGATA, Takahiro
;
YOSHIKAWA, Hideki
- キーワード
- Auger depth profiling analysis, HfO2/Si, Ultra low angle incidence ion beam
- 刊行年月日
- 2019-03-07
- 更新時刻
- 2024-10-08 12:20:27 +0900
Raw data files for Fig. 5 Auger depth profiles in "Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam"
- データセット
- 著者
-
OGIWARA, Toshiya
;
NAGATA, Takahiro
;
YOSHIKAWA, Hideki
- キーワード
- Auger depth profiling analysis, HfO2/Si, Ultra low angle incidence ion beam
- 刊行年月日
- 2019-03-07
- 更新時刻
- 2024-03-30 18:50:38 +0900