Measurement of the Low-Energy Electron Inelastic Mean Free Path in Monolayer Graphene

Journal article

Creator

Bo Da (author) (Search by this author)

https://orcid.org/0000-0002-0785-8662

National Institute for Materials Science

NIMS Researchers Directory SAMURAI

Bo Da ;

Yang Sun (author) (Search by this author)

Yang Sun ;

Zhufeng Hou (author) (Search by this author)

https://orcid.org/0000-0002-0069-5573 (unauthenticated)

National Institute for Materials Science

Zhufeng Hou ;

Jiangwei Liu (author) (Search by this author)

https://orcid.org/0000-0003-2580-7401

National Institute for Materials Science

NIMS Researchers Directory SAMURAI

Jiangwei Liu ;

Nguyen Thanh Cuong (author) (Search by this author)

https://orcid.org/0000-0003-1085-3448 (unauthenticated)

National Institute for Materials Science

Nguyen Thanh Cuong ;

Kazuhito Tsukagoshi (author) (Search by this author)

https://orcid.org/0000-0001-9710-2692

National Institute for Materials Science

NIMS Researchers Directory SAMURAI

Kazuhito Tsukagoshi ;

Hideki Yoshikawa (author) (Search by this author)

https://orcid.org/0000-0002-7389-8865

National Institute for Materials Science

NIMS Researchers Directory SAMURAI

Hideki Yoshikawa ;

Shigeo Tanuma (author) (Search by this author)

https://orcid.org/0000-0003-2628-9941

National Institute for Materials Science

NIMS Researchers Directory SAMURAI

Shigeo Tanuma ;

Jin Hu (author) (Search by this author)

Jin Hu ;

Zhaoshun Gao (author) (Search by this author)

Zhaoshun Gao ;

Zejun Ding (author) (Search by this author)

Zejun Ding

Keyword

inelastic mean free path, monolayer graphene, four-point probe technique

Date published

2020-04-21

Updated at

2024-01-05 22:12:02 +0900