論文 Measurement of the Low-Energy Electron Inelastic Mean Free Path in Monolayer Graphene

Bo Da SAMURAI ORCID (National Institute for Materials ScienceROR) ; Yang Sun ; Zhufeng Hou ORCID (National Institute for Materials ScienceROR) ; Jiangwei Liu SAMURAI ORCID (National Institute for Materials ScienceROR) ; Nguyen Thanh Cuong ORCID (National Institute for Materials ScienceROR) ; Kazuhito Tsukagoshi SAMURAI ORCID (National Institute for Materials ScienceROR) ; Hideki Yoshikawa SAMURAI ORCID (National Institute for Materials ScienceROR) ; Shigeo Tanuma SAMURAI ORCID (National Institute for Materials ScienceROR) ; Jin Hu ; Zhaoshun Gao ; Zejun Ding

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引用
Bo Da, Yang Sun, Zhufeng Hou, Jiangwei Liu, Nguyen Thanh Cuong, Kazuhito Tsukagoshi, Hideki Yoshikawa, Shigeo Tanuma, Jin Hu, Zhaoshun Gao, Zejun Ding. Measurement of the Low-Energy Electron Inelastic Mean Free Path in Monolayer Graphene. Physical Review Applied. 2020, 13 (4), 44055-44055. https://doi.org/10.1103/PhysRevApplied.13.044055
SAMURAI

説明:

(abstract)

Measuring the electron-transport properties of substrate-supported nanomaterials with the traditional two-point comparison method is difficult at electron energies below 50 eV, where core-level signals are too feeble to be detected against the strong secondary-electron background. Herein, a data-driven spectral analysis technique is used to study the low-energy electron-transport properties of substrate-supported target nanomaterials, while eliminating the influence of the substrate signal.

権利情報:

キーワード: inelastic mean free path, monolayer graphene, four-point probe technique

刊行年月日: 2020-04-21

出版者: American Physical Society (APS)

掲載誌:

  • Physical Review Applied (ISSN: 23317019) vol. 13 issue. 4 p. 44055-44055

研究助成金:

原稿種別: 著者最終稿 (Accepted manuscript)

MDR DOI: https://doi.org/10.48505/nims.3874

公開URL: https://doi.org/10.1103/PhysRevApplied.13.044055

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更新時刻: 2024-01-05 22:12:02 +0900

MDRでの公開時刻: 2023-04-03 16:22:38 +0900

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