Measurement of the Low-Energy Electron Inelastic Mean Free Path in Monolayer Graphene

Bo Da; Yang Sun; Zhufeng Hou; Jiangwei Liu; Nguyen Thanh Cuong; Kazuhito Tsukagoshi; Hideki Yoshikawa; Shigeo Tanuma; Jin Hu; Zhaoshun Gao; Zejun Ding

doi:10.1103/PhysRevApplied.13.044055

Article Measurement of the Low-Energy Electron Inelastic Mean Free Path in Monolayer Graphene

Bo Da (National Institute for Materials Science) ; Yang Sun ; Zhufeng Hou (National Institute for Materials Science) ; Jiangwei Liu (National Institute for Materials Science) ; Nguyen Thanh Cuong (National Institute for Materials Science) ; Kazuhito Tsukagoshi (National Institute for Materials Science) ; Hideki Yoshikawa (National Institute for Materials Science) ; Shigeo Tanuma (National Institute for Materials Science) ; Jin Hu ; Zhaoshun Gao ; Zejun Ding

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Bo Da, Yang Sun, Zhufeng Hou, Jiangwei Liu, Nguyen Thanh Cuong, Kazuhito Tsukagoshi, Hideki Yoshikawa, Shigeo Tanuma, Jin Hu, Zhaoshun Gao, Zejun Ding. Measurement of the Low-Energy Electron Inelastic Mean Free Path in Monolayer Graphene. Physical Review Applied. 2020, 13 (4), 44055-44055. https://doi.org/10.1103/PhysRevApplied.13.044055

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(abstract)

Measuring the electron-transport properties of substrate-supported nanomaterials with the traditional two-point comparison method is difficult at electron energies below 50 eV, where core-level signals are too feeble to be detected against the strong secondary-electron background. Herein, a data-driven spectral analysis technique is used to study the low-energy electron-transport properties of substrate-supported target nanomaterials, while eliminating the influence of the substrate signal.

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Keyword: inelastic mean free path, monolayer graphene, four-point probe technique

Date published: 2020-04-21

Publisher: American Physical Society (APS)

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Physical Review Applied (ISSN: 23317019) vol. 13 issue. 4 p. 44055-44055

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Manuscript type: Author's version (Accepted manuscript)

MDR DOI: https://doi.org/10.48505/nims.3874

First published URL: https://doi.org/10.1103/PhysRevApplied.13.044055

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Updated at: 2024-01-05 22:12:02 +0900

Published on MDR: 2023-04-03 16:22:38 +0900

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