論文・データセット - MDR: NIMS Materials Data Repository

ファイル種別: application/pdf キーワード: HAXPES

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HZO_Operando_SPring-8.pdf

Electron trapping/detrapping at oxygen vacancies and imprint evolution in La-doped Hf0.5Zr0.5O2 ferroelectric capacitors probed by hard x-ray photoelectron spectroscopy

ジャーナル論文
著者: W. Hamouda (author) (この著者で検索)

https://orcid.org/0000-0002-7055-7264 (unauthenticated)

;

Y. Yamashita (author) (この著者で検索)

https://orcid.org/0000-0003-0994-8095

NIMS Researchers Directory SAMURAI

;

S. Ueda (author) (この著者で検索)

https://orcid.org/0000-0001-9425-0614

NIMS Researchers Directory SAMURAI

;

S. Matzen (author) (この著者で検索)

https://orcid.org/0000-0002-4244-6516 (unauthenticated)

;

O. Renault (author) (この著者で検索)

https://orcid.org/0000-0002-0683-9590 (unauthenticated)

;

F. Mehmood (author) (この著者で検索)

https://orcid.org/0000-0002-9530-380X (unauthenticated)

;

T. Mikolajick (author) (この著者で検索)

https://orcid.org/0000-0003-3814-0378 (unauthenticated)

;

U. Schroeder (author) (この著者で検索)

https://orcid.org/0000-0002-6824-2386 (unauthenticated)

;

N. Barrett (author) (この著者で検索)

https://orcid.org/0000-0002-8228-0805 (unauthenticated)
キーワード: Hf0.5Zr0.5O2, HAXPES, operando
刊行年月日: 2025-11-03
更新時刻: 2025-11-13 12:30:12 +0900

SM_CMS_VT_VP_HAXPES_v5.pdf

Temperature- and depth-dependent valence band electronic structures of half-metallic ${Co}_{2} MnSi$ studied by hard x-ray photoemission spectroscopy

ジャーナル論文
著者: Shigenori Ueda (author) (この著者で検索)

https://orcid.org/0000-0001-9425-0614

NIMS Researchers Directory SAMURAI

;

Yuichi Fujita (author) (この著者で検索)

https://orcid.org/0000-0002-1798-1066

;

Ivan Kurniawan (author) (この著者で検索)

https://orcid.org/0000-0001-5419-0047

NIMS Researchers Directory SAMURAI

;

Yuya Sakuraba (author) (この著者で検索)

https://orcid.org/0000-0003-4618-9550

NIMS Researchers Directory SAMURAI

;

Yoshio Miura (author) (この著者で検索)

https://orcid.org/0000-0002-5605-5452

NIMS Researchers Directory SAMURAI
キーワード: Co2MnSi, HAXPES, Temperature dependence, Interface and bulk electronic states, interface and bulk magnetic properties, X-ray polarization dependence
刊行年月日: 2026-02-18
更新時刻: 2026-02-21 08:30:04 +0900

Bombsch_Adv_Funct_Mater2024.pdf

Chemical Interface Structures in CdS/RbInSe₂/Cu(In,Ga)Se₂ Thin‐Film Solar Cell Stacks

ジャーナル論文
著者: Jakob Bombsch (author) (この著者で検索)

https://orcid.org/0000-0002-0820-162X (unauthenticated)

;

Tim Kodalle (author) (この著者で検索)

https://orcid.org/0000-0002-8792-9669 (unauthenticated)

;

Raul Garcia‐Diez (author) (この著者で検索)

https://orcid.org/0009-0000-9374-1083 (unauthenticated)

;

Claudia Hartmann (author) (この著者で検索)

;

Roberto Félix (author) (この著者で検索)

;

Shigenori Ueda (author) (この著者で検索)

https://orcid.org/0000-0001-9425-0614

NIMS Researchers Directory SAMURAI

;

Regan G. Wilks (author) (この著者で検索)

https://orcid.org/0000-0001-5822-8399 (unauthenticated)

;

Christian A. Kaufmann (author) (この著者で検索)

https://orcid.org/0000-0001-9168-2032 (unauthenticated)

;

Marcus Bär (author) (この著者で検索)

https://orcid.org/0000-0001-8581-0691 (unauthenticated)
キーワード: Thin-film solar cell stack, interface, Chemical analysis, hard X-ray photoemission spectroscopy, HAXPES
刊行年月日: 2024-05-06
更新時刻: 2024-08-01 16:30:13 +0900