2 件のレコードが見つかりました。
All About the Interface: Do Residual Contaminants at A High‐Quality h‐BN Monolayer Perylene Diimide Interface Cause Charge Trapping?
- ジャーナル論文
- 著者
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;Lukas Renn (author) (この著者で検索);Lisa S. Walter (author) (この著者で検索)Kenji Watanabe (author) (この著者で検索)National Institute for Materials Science
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Takashi Taniguchi (author) (この著者で検索)National Institute for Materials Science
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R. Thomas Weitz (author) (この著者で検索) - キーワード
- Charge transport, organic semiconducting crystals, hexagonal boron nitride
- 刊行年月日
- 2022-01-29
- 更新時刻
- 2025-02-26 08:30:49 +0900
Dielectric strength weakening of hexagonal boron nitride nanosheets under mechanical stress
- ジャーナル論文
- 著者
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;Bingjie Wang (author) (この著者で検索);Chuanli Yu (author) (この著者で検索);Yifan Jiang (author) (この著者で検索);Chong Tian (author) (この著者で検索);Jiamin Tian (author) (この著者で検索);Shuo Li (author) (この著者で検索);Zheng Fang (author) (この著者で検索);Menglan Li (author) (この著者で検索);Weilong Wu (author) (この著者で検索);Zhaohe Dai (author) (この著者で検索)Takashi Taniguchi (author) (この著者で検索)National Institute for Materials Science
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Kenji Watanabe (author) (この著者で検索)National Institute for Materials Science
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;Qing Chen (author) (この著者で検索)Xianlong Wei (author) (この著者で検索)
- キーワード
- hexagonal boron nitride, dielectric strength , mechanical stress
- 刊行年月日
- 2025-08-29
- 更新時刻
- 2026-02-17 08:30:11 +0900