ファイル種別: application/pdf キーワード: atom probe tomography
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Vacancy-Type Defects and Oxygen Incorporation in NiAl for Advanced Interconnects Probed by Monoenergetic Positron Beams and Atom Probe Tomography.pdf
Vacancy-Type Defects and Oxygen Incorporation in NiAl for Advanced Interconnects Probed by Monoenergetic Positron Beams and Atom Probe Tomography
ジャーナル論文
著者
Akira Uedono (author) (この著者で検索)
ORCID ;
Claudia Fleischmann (author) (この著者で検索)
ORCID ;
Jean-Philippe Soulié (author) (この著者で検索)
;
Mustafa Ayyad (author) (この著者で検索)
;
Jeroen E. Scheerder (author) (この著者で検索)
ORCID ;
Christoph Adelmann (author) (この著者で検索)
; ORCID SAMURAI ; ORCID SAMURAI ;
Koji Michishio (author) (この著者で検索)
ORCID ;
Nagayasu Oshima (author) (この著者で検索)
;
Shoji Ishibashi (author) (この著者で検索)
ORCID
キーワード
atom probe tomography, positron annihilation
刊行年月日
2024-07-10
更新時刻
2025-07-10 08:30:19 +0900
Effect of sequential N ion implantation in the formation of a shallow Mg-implanted p-type GaN layer.pdf
Effect of sequential N ion implantation in the formation of a shallow Mg-implanted p-type GaN layer
ジャーナル論文
著者
Jun Uzuhashi (author) (この著者で検索)
National Institute for Materials Science Research Center for Magnetic and Spintronic Materials/Administrative Office
ORCID SAMURAI ;
Jun Chen (author) (この著者で検索)
National Institute for Materials Science Research Center for Electronic and Optical Materials/Optical Materials Field/Semiconductor Defect Design Group
ORCID SAMURAI ;
Ryo Tanaka (author) (この著者で検索)
Fuji Electric Corporation
;
Shinya Takashima (author) (この著者で検索)
Fuji Electric Corporation
;
Masaharu Edo (author) (この著者で検索)
Fuji Electric Corporation
;
Tadakatsu Ohkubo (author) (この著者で検索)
National Institute for Materials Science Research Center for Magnetic and Spintronic Materials
ORCID SAMURAI ;
Takashi Sekiguchi (author) (この著者で検索)
University of Tsukuba
キーワード
gallium nitride, atom probe tomography, transmission electron microscopy, cathodoluminescence
刊行年月日
2024-08-07
更新時刻
2024-08-03 08:30:15 +0900