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Raw data files for Fig. 11 Auger depth profiles in "Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam"
- データセット
- 著者
-
OGIWARA, Toshiya (author) (この著者で検索)National Institute for Materials Science
;
NAGATA, Takahiro (author) (この著者で検索)National Institute for Materials Science
;
YOSHIKAWA, Hideki (author) (この著者で検索)National Institute for Materials Science
- キーワード
- Auger depth profiling analysis, HfO2/Si, Ultra low angle incidence ion beam
- 刊行年月日
- 2019-03-07
- 更新時刻
- 2024-04-07 22:57:41 +0900
Raw data files for Fig. 10 Auger depth profiles in "Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam"
- データセット
- 著者
-
OGIWARA, Toshiya (author) (この著者で検索)National Institute for Materials Science
;
NAGATA, Takahiro (author) (この著者で検索)National Institute for Materials Science
;
YOSHIKAWA, Hideki (author) (この著者で検索)National Institute for Materials Science
- キーワード
- Auger depth profiling analysis, HfO2/Si, Ultra low angle incidence ion beam
- 刊行年月日
- 2019-03-07
- 更新時刻
- 2024-01-05 22:12:41 +0900
Raw data files for Fig. 9 Auger depth profiles in "Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam"
- データセット
- 著者
-
OGIWARA, Toshiya (author) (この著者で検索)National Institute for Materials Science
;
NAGATA, Takahiro (author) (この著者で検索)National Institute for Materials Science
;
YOSHIKAWA, Hideki (author) (この著者で検索)National Institute for Materials Science
- キーワード
- Auger depth profiling analysis, HfO2/Si, Ultra low angle incidence ion beam
- 刊行年月日
- 2019-03-07
- 更新時刻
- 2024-10-08 12:20:27 +0900
Raw data files for Fig. 5 Auger depth profiles in "Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam"
- データセット
- 著者
-
OGIWARA, Toshiya (author) (この著者で検索)National Institute for Materials Science
;
NAGATA, Takahiro (author) (この著者で検索)National Institute for Materials Science
;
YOSHIKAWA, Hideki (author) (この著者で検索)National Institute for Materials Science
- キーワード
- Auger depth profiling analysis, HfO2/Si, Ultra low angle incidence ion beam
- 刊行年月日
- 2019-03-07
- 更新時刻
- 2024-03-30 18:50:38 +0900
Raw data files for Fig. 6 Auger depth profiles in "Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam"
- データセット
- 著者
-
OGIWARA, Toshiya (author) (この著者で検索)National Institute for Materials Science
;
NAGATA, Takahiro (author) (この著者で検索)National Institute for Materials Science
;
YOSHIKAWA, Hideki (author) (この著者で検索)National Institute for Materials Science
- キーワード
- Auger depth profiling analysis, HfO2/Si, Ultra low angle incidence ion beam
- 刊行年月日
- 2019-03-07
- 更新時刻
- 2024-03-30 18:50:25 +0900
Raw data files for Fig. 7 Auger depth profiles in "Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam"
- データセット
- 著者
-
OGIWARA, Toshiya (author) (この著者で検索)National Institute for Materials Science
;
NAGATA, Takahiro (author) (この著者で検索)National Institute for Materials Science
;
YOSHIKAWA, Hideki (author) (この著者で検索)National Institute for Materials Science
- キーワード
- Auger depth profiling analysis, HfO2/Si, Ultra low angle incidence ion beam
- 刊行年月日
- 2019-03-07
- 更新時刻
- 2024-01-05 22:12:25 +0900
Raw data files for Fig. 8 Auger depth profiles in "Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam"
- データセット
- 著者
-
OGIWARA, Toshiya (author) (この著者で検索)National Institute for Materials Science
;
NAGATA, Takahiro (author) (この著者で検索)National Institute for Materials Science
;
YOSHIKAWA, Hideki (author) (この著者で検索)National Institute for Materials Science
- キーワード
- Auger depth profiling analysis, HfO2/Si, Ultra low angle incidence ion beam
- 刊行年月日
- 2019-03-07
- 更新時刻
- 2024-01-05 22:11:29 +0900
Multi-objective topology optimization of porous microstructure in die-bonding layer of a semiconductor
- ジャーナル論文
- 著者
-
Jiaxin Zhou (author) (この著者で検索)National Institute for Materials Science
;
Ikumu Watanabe (author) (この著者で検索)National Institute for Materials Science
;
;Weikang Song (author) (この著者で検索);Keita Kambayashi (author) (この著者で検索)Ta-Te Chen (author) (この著者で検索)
https://orcid.org/0000-0002-0553-4736
(unauthenticated)
- キーワード
- Multi-objective topology optimization, microstructure design, porous microstructure, highthroughput evaluation, finite element analysis
- 刊行年月日
- 2024-12-31
- 更新時刻
- 2024-04-12 16:30:17 +0900
Comparative experimental and theoretical study on anomalous Nernst effect of Heusler alloy Co 2 FeSi thin film: estimation of on-site Coulomb interaction at Co site
- ジャーナル論文
- 著者
-
Weinan Zhou (author) (この著者で検索)
;
Keisuke Masuda (author) (この著者で検索)
;
Kazuki Sumida (author) (この著者で検索)
https://orcid.org/0000-0002-5783-3703
(unauthenticated)
;
Yuichi Fujita (author) (この著者で検索)
;
Akio Kimura (author) (この著者で検索)
https://orcid.org/0000-0002-1501-3918
(unauthenticated)
;
Yuya Sakuraba (author) (この著者で検索)
- キーワード
- Heusler alloy, Co2FeSi, on-site Coulomb interaction, anomalous Nernst effect, anomalous Nernst conductivity, anisotropic magnetoresistance effect, anomalous Hall effect
- 刊行年月日
- 2025-12-31
- 更新時刻
- 2025-11-06 12:30:05 +0900
Nanowire Electrode Structures Enhanced Direct Extracellular Electron Transport via Cell-Surface Multi-Heme Cytochromes in Desulfovibrio ferrophilus IS5
- ジャーナル論文
- 著者
-
Xiao Deng (author) (この著者で検索)National Institute for Materials Science
;
Wipakorn Jevasuwan (author) (この著者で検索)National Institute for Materials Science
;
Naoki Fukata (author) (この著者で検索)National Institute for Materials Science
;
Akihiro Okamoto (author) (この著者で検索)National Institute for Materials Science
- キーワード
- cell attachment, differential pulse voltammetry, electrochemical analysis, nanostructure, outer-membrane cytochrome, scanning electron microscopy
- 刊行年月日
- 2024-08-13
- 更新時刻
- 2024-09-03 08:30:25 +0900