File type: application/pdf Keyword: atomic force microscope
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2 records found.

acs.nanolett.2c04765.pdf
Approaching the Intrinsic Properties of Moiré Structures Using Atomic Force Microscopy Ironing
Article
Creator
Swaroop Kumar Palai ; Mateusz Dyksik ; Nikodem Sokolowski ; Mariusz Ciorga ; Estrella Sánchez Viso ; Yong Xie ; Alina Schubert ; Takashi Taniguchi SAMURAI ORCID ; Kenji Watanabe SAMURAI ORCID ; Duncan K. Maude ; Alessandro Surrente ; Michał Baranowski ; Andres Castellanos-Gomez ; Carmen Munuera ; Paulina Plochocka
Keyword
Transition metal dichalcogenides, moiré pattern, atomic force microscope
Date published
2023-06-14
Updated at
2025-02-15 12:30:13 +0900
表面科学_17_1996_758.pdf
Depth Profiling Analysis of InP/GaInAsP Multilayers by Auger Electron Spectroscopy, Quantitative Evaluation of the Surface Roughness Caused by Ion Sputtering
Article
Creator
OGIWARA, Toshiya SAMURAI ORCID ; TANUMA, Shigeo SAMURAI ORCID
Keyword
depth resolution function, InP/GaInAsP multilayer specimens, Auger depth profiling analysis, surface roughness, atomic force microscope
Date published
2011-06-10
Updated at
2022-10-03 01:24:02 +0900