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Article(3)
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Kelvin probe force microscopy (3)
GaAs(110) (2)
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Electrostatic force (1)
Fermi level pinning (1)
p-n junction (1)
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Keyword: Kelvin probe force microscopy
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3 records found.
Influence of Fermi level pinning on contact potential difference measurements using Kelvin probe force microscopy
Article
Creator
Nobuyuki Ishida
Keyword
Kelvin probe force microscopy
,
Simulation
,
Electrostatic force
,
Fermi level pinning
Date published
2025-03-07
Updated at
2025-03-10 16:30:14 +0900
Quantitative theoretical analysis of the electrostatic force between a metallic tip and semiconductor surface in Kelvin probe force microscopy
Article
Creator
Nobuyuki Ishida
;
Takaaki Mano
Keyword
Kelvin probe force microscopy
,
Simulation
,
GaAs(110)
Date published
2025-02-17
Updated at
2025-12-03 08:30:21 +0900
Quantitative characterization of built-in potential profile across GaAs p–n junctions using Kelvin probe force microscopy with qPlus sensor AFM
Article
Creator
Nobuyuki Ishida
;
Takaaki Mano
Keyword
GaAs(110)
,
Kelvin probe force microscopy
,
p-n junction
,
qPlus sensor
Date published
2024-02-05
Updated at
2024-04-04 08:30:11 +0900
Keyword
Kelvin probe force microscopy
(3)
GaAs(110)
(2)
Simulation
(2)
Electrostatic force
(1)
Fermi level pinning
(1)
p-n junction
(1)
qPlus sensor
(1)
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