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Article(3)
Keyword
C60 ion (3)
ion track (3)
silicon (2)
swift heavy ion (2)
cluster effect (1)
diamond (1)
synergy effect (1)
track recrystallization (1)
transmission electron microscopy (1)
velocity effect (1)
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Keyword: C60 ion
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3 records found.
An extraordinarily low-energy threshold of less than 60 keV for ion track formation in silicon
Article
Creator
H. Amekura
; K. Narumi ; A. Chiba ; Y. Hirano ; K. Yamada ; S. Yamamoto ; Y. Saitoh
Keyword
ion track
,
C60 ion
,
silicon
,
cluster effect
,
swift heavy ion
Date published
2024-12-09
Updated at
2025-01-21 12:30:27 +0900
Latent ion tracks were finally observed in diamond
Article
Creator
H. Amekura
;
A. Chettah
;
K. Narumi
; A. Chiba ; Y. Hirano ; K. Yamada ; S. Yamamoto ;
A. A. Leino
;
F. Djurabekova
;
K. Nordlund
; N. Ishikawa ; N. Okubo ; Y. Saitoh
Keyword
ion track
,
diamond
,
C60 ion
,
transmission electron microscopy
,
velocity effect
Date published
2024-02-27
Updated at
2024-03-04 16:30:07 +0900
Mechanism of ion track formation in silicon by much lower energy deposition than the formation threshold
Article
Creator
H Amekura
; K Narumi ; A Chiba ; Y Hirano ; K Yamada ; S Yamamoto ; N Ishikawa ; N Okubo ; M Toulemonde ; Y Saitoh
Keyword
C60 ion
,
ion track
,
swift heavy ion
,
silicon
,
synergy effect
,
track recrystallization
Date published
2023-04-01
Updated at
2024-01-05 22:12:20 +0900
Keyword
C60 ion
(3)
ion track
(3)
silicon
(2)
swift heavy ion
(2)
cluster effect
(1)
diamond
(1)
synergy effect
(1)
track recrystallization
(1)
transmission electron microscopy
(1)
velocity effect
(1)
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