Ptychographical reconstruction code by Wigner Distribution Deconvolution （WDD）
- ソフトウェア
- 著者
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Nakazawa Katsuaki (author) (この著者で検索)National Institute for Materials Science ICYS
;
Mitsuishi Kazutaka (author) (この著者で検索)National Institute for Materials Science Research Center for Advanced Measurement and Characterization
- キーワード
- ptychography, 4DSTEM, electron microscopy, Wigner distribution deconvolution, aberration correction
- 刊行年月日
- 2022-11-30
- 更新時刻
- 2023-02-03 17:43:11 +0900
First-principles calculations of optical constants
- データセット
- 著者
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SHINOTSUKA, Hiroshi (author) (この著者で検索)
;
YOSHIKAWA, Hideki (author) (この著者で検索)
;
TANUMA, Shigeo (author) (この著者で検索)
- キーワード
- first-principles calculation, energy loss function, optical constant, compound semiconductor
- 刊行年月日
- 2021-07-06
- 更新時刻
- 2022-10-03 02:03:24 +0900