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Resource type
Journal article(3)
Keyword
scanning probe microscopy (3)
cerium dioxide (1)
data management (1)
density functional theory (1)
international standardization (1)
sample handling (1)
surface (1)
terminology (1)
thin films (1)
water (1)
(more)
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Creative Commons BY-NC-ND Attribution-NonCommercial-NoDerivs 4.0 International (1)
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application/pdf (2)
application/msword (1)
video/mp4 (1)
Keyword: scanning probe microscopy
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3 records found.
Near-surface defects break symmetry in water adsorption on CeO2−x(111)
Journal article
Creator
Oscar Custance
(author) (
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)
https://orcid.org/0000-0001-7931-603X
NIMS Researchers Directory SAMURAI
Oscar Custance
;
Manuel González Lastre
(author) (
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)
https://orcid.org/0009-0000-2299-6687
(unauthenticated)
Manuel González Lastre
;
Kyungmin Kim
(author) (
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)
https://orcid.org/0000-0002-3147-5100
(unauthenticated)
Kyungmin Kim
;
Estefanía Fernández-Villanueva
(author) (
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)
https://orcid.org/0000-0002-9419-0786
(unauthenticated)
Estefanía Fernández-Villanueva
;
Pablo Pou
(author) (
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)
https://orcid.org/0000-0002-5854-8218
(unauthenticated)
Pablo Pou
;
Masayuki Abe
(author) (
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)
https://orcid.org/0000-0001-5619-3911
(unauthenticated)
Masayuki Abe
;
Hossein Sepehri-Amin
(author) (
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)
https://orcid.org/0000-0002-7856-7897
NIMS Researchers Directory SAMURAI
Hossein Sepehri-Amin
;
Shigeki Kawai
(author) (
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)
https://orcid.org/0000-0003-2128-0120
NIMS Researchers Directory SAMURAI
Shigeki Kawai
;
M. Verónica Ganduglia-Pirovano
(author) (
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https://orcid.org/0000-0003-2408-8898
(unauthenticated)
M. Verónica Ganduglia-Pirovano
;
Ruben Perez
(author) (
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)
https://orcid.org/0000-0001-5896-541X
(unauthenticated)
Ruben Perez
Keyword
scanning probe microscopy
,
cerium dioxide
,
water
,
surface
,
thin films
,
density functional theory
Date published
2026-01-23
Updated at
2026-02-08 08:30:20 +0900
International Standardization of Terminology, Sample Handling and Data Transfer Format for Scanning Probe Microscopy
Journal article
Creator
Keiko ONISHI
(author) (
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)
https://orcid.org/0000-0003-3979-8905
NIMS Researchers Directory SAMURAI
Keiko ONISHI
Keyword
scanning probe microscopy
,
international standardization
,
terminology
,
sample handling
,
data management
Date published
2025-01-10
Updated at
2025-04-03 08:30:13 +0900
Development of UHV scanning probe microscope with external stress and strain application
Journal article
Creator
FUJITA, Daisuke
(author) (
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)
https://orcid.org/0000-0001-7025-0265
NIMS Researchers Directory SAMURAI
FUJITA, Daisuke
Keyword
scanning probe microscopy
Date published
[2007]
Updated at
2022-10-03 01:29:28 +0900
Keyword
scanning probe microscopy
(3)
cerium dioxide
(1)
data management
(1)
density functional theory
(1)
international standardization
(1)
sample handling
(1)
surface
(1)
terminology
(1)
thin films
(1)
water
(1)
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