Development of UHV scanning probe microscope with external stress and strain application

Article Development of UHV scanning probe microscope with external stress and strain application

FUJITA, Daisuke. Development of UHV scanning probe microscope with external stress and strain application. https://doi.org/10.34968/nims.1365

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Keyword: scanning probe microscopy

Date published: [2007]

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Manuscript type: Author's version (Accepted manuscript)

MDR DOI: https://doi.org/10.34968/nims.1365

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Updated at: 2022-10-03 01:29:28 +0900

Published on MDR: 2021-08-14 03:55:17 +0900

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