Summary of ISO/TC 201 Standard: XX ISO 18118: 2004 — Surface chemical analysis — Auger electron spectroscopy and X-ray photoelectron spectroscopy —Guide to the use of experimentally determined relative sensitivity factors for the quantitative analysis of homogeneous materials

Journal article

Creator

TANUMA, Shigeo (author) (Search by this author)

https://orcid.org/0000-0003-2628-9941

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TANUMA, Shigeo

Keyword

XPS, quantitative surface analysis, X-ray photoelectron spectroscopy, Auger electron spectroscopy, relative sensitivity factor, ISO, International Organization for Standardization, AES

Date published

2005-12-28

Updated at

2024-01-05 22:11:34 +0900