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Journal article(2)
Keyword
mean escape depth (2)
MED (1)
asymmetry parameter (1)
effective attenuation length (1)
high-energy photoelectron spectroscopy (1)
inelastic mean free path (1)
information depth (1)
lnearly polarized X-rays (1)
surface sensitivity (1)
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Keyword: mean escape depth
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2 records found.
電子分光法における表面感度と検出深さ
Journal article
Creator
田沼 繁夫
(author) (
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https://orcid.org/0000-0003-2628-9941
統合型材料開発・情報基盤部門/材料データプラットフォームセンター/データサービスチーム, 物質・材料研究機構
NIMS Researchers Directory SAMURAI
田沼 繁夫
Keyword
surface sensitivity
,
mean escape depth
,
effective attenuation length
,
information depth
,
inelastic mean free path
Date published
2022-03-10
Updated at
2024-01-05 22:12:47 +0900
Calculations of Mean Escape Depths of Photoelectrons in Elemental Solids Excited by Linearly Polarized X-rays for High-Energy Photoelectron Spectroscopy
Journal article
Creator
Yoshikawa, Hideki
(author) (
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)
https://orcid.org/0000-0002-7389-8865
NIMS Researchers Directory SAMURAI
Yoshikawa, Hideki
;
Shinotsuka, Hiroshi
(author) (
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)
https://orcid.org/0000-0001-5147-1396
NIMS Researchers Directory SAMURAI
Shinotsuka, Hiroshi
;
Tanuma, Shigeo
(author) (
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)
https://orcid.org/0000-0003-2628-9941
NIMS Researchers Directory SAMURAI
Tanuma, Shigeo
;
Ueda, Ryuichi
(author) (
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)
Ueda, Ryuichi
Keyword
MED
,
high-energy photoelectron spectroscopy
,
asymmetry parameter
,
lnearly polarized X-rays
,
mean escape depth
Date published
2013-09-12
Updated at
2024-01-05 22:12:03 +0900
Keyword
mean escape depth
(2)
MED
(1)
asymmetry parameter
(1)
effective attenuation length
(1)
high-energy photoelectron spectroscopy
(1)
inelastic mean free path
(1)
information depth
(1)
lnearly polarized X-rays
(1)
surface sensitivity
(1)
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