4 records found.
Inelastic Mean Free Paths, Mean Escape Depths, and Effective Attenuation Lengths for Surface Electron Spectroscopies
- Conference presentation
- Creator
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田沼 繁夫 (author) (Search by this author)
;
;後藤啓典 (author) (Search by this author)産総研吉川 英樹 (author) (Search by this author)
;
;パウエル (author) (Search by this author)NIST;Penn, D. R. (author) (Search by this author)NIST;Da, B. (author) (Search by this author)物質・材料研究機構;Ueda, R. (author) (Search by this author)物質・材料研究機構Shinotsuka, H (author) (Search by this author)物質・材料研究機構 - Keyword
- EPES, IMFP, EAL, elemental solids, inorganic compounds, water
- Date published
- Updated at
- 2023-06-29 11:57:06 +0900
Calculations of Electron Inelastic Mean Free Paths for 31 Materials
- Journal article
- Creator
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Tanuma, S. (author) (Search by this author)National Bureau of Standards
;
;Powell, C. J. (author) (Search by this author)National Bureau of StandardsPenn, D. R. (author) (Search by this author)National Bureau of Standards
- Keyword
- IMFP, inelastic mean free path, Bethe equation, TPP, elemental solids
- Date published
- 2004-09-15
- Updated at
- 2023-06-09 15:50:37 +0900
Calculations of electron inelastic mean free paths. IX. Data for 41 elemental solids over the 50 eV to 30 keV range
- Journal article
- Creator
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Tanuma, Shigeo (author) (Search by this author)
;
Powell, C. J. (author) (Search by this author)
https://orcid.org/0000-0001-8990-2286
(unauthenticated)
;
Penn, D. R. (author) (Search by this author) - Keyword
- IMFP, TPP-2M, electron inelastic mean free paths, elemental solids
- Date published
- 2011-02-08
- Updated at
- 2024-01-05 22:14:03 +0900
Calculation of Electron Inelastic Mean Free Paths (IMFPs). VII. Reliability of the TPP-2M IMFP Predictive Equation
- Journal article
- Creator
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Tanuma, Shigeo (author) (Search by this author)
;
Powell, C. J. (author) (Search by this author)
https://orcid.org/0000-0001-8990-2286
(unauthenticated)
;
Penn, D. R. (author) (Search by this author)
- Keyword
- IMFP, TPP-2M, number of valence electrons, elemental solids, XPS, electron inelastic mean free paths, surface sensitivity, IMFPs, AES, surface analysis
- Date published
- 2003-02-11
- Updated at
- 2022-10-03 01:54:38 +0900