2 records found.
Robust Preparation of Sub‐20‐nm‐Thin Lamellae for Aberration‐Corrected Electron Microscopy
- Journal article
- Creator
-
Hideyo Tsurusawa (author) (Search by this author)
https://orcid.org/0000-0001-9786-8997
(unauthenticated)
;
Jun Uzuhashi (author) (Search by this author)
;
Yusuke Kozuka (author) (Search by this author)
;
Koji Kimoto (author) (Search by this author)
;
Tadakatsu Ohkubo (author) (Search by this author)
- Keyword
- TEM, FIB, Automation
- Date published
- 2024-02-22
- Updated at
- 2024-05-03 08:30:11 +0900
In-depth S/TEM observation of Ti–Hf and Ta–Hf-doped Nb3Sn layers
- Journal article
- Creator
-
Nobuya Banno (author) (Search by this author)National Institute for Materials Science
;
Taku Moronaga (author) (Search by this author)National Institute for Materials Science
;
Toru Hara (author) (Search by this author)National Institute for Materials Science
;
;Koki Asai (author) (Search by this author)Tsuyoshi Yagai (author) (Search by this author)
https://orcid.org/0000-0003-1842-7881
(unauthenticated)
- Keyword
- Nb3Sn, Hf doping, ACOM-TEM, TEM, grain growth
- Date published
- 2024-03-01
- Updated at
- 2025-02-14 12:31:24 +0900