In-depth S/TEM observation of Ti–Hf and Ta–Hf-doped Nb<sub>3</sub>Sn layers

Nobuya Banno; Taku Moronaga; Toru Hara; Koki Asai; Tsuyoshi Yagai

doi:10.1088/1361-6668/ad2982

論文 In-depth S/TEM observation of Ti–Hf and Ta–Hf-doped Nb₃Sn layers

Nobuya Banno (National Institute for Materials Science) ; Taku Moronaga (National Institute for Materials Science) ; Toru Hara (National Institute for Materials Science) ; Koki Asai ; Tsuyoshi Yagai

Proof_SUST_v37_n3_2024_035019_(Banno_STEM-HfTa-HfTi-Nb3Sn).pdf

Download file (2.24MB)
Download as zip (2.17MB)

コレクション

引用

Nobuya Banno, Taku Moronaga, Toru Hara, Koki Asai, Tsuyoshi Yagai. In-depth S/TEM observation of Ti–Hf and Ta–Hf-doped Nb₃Sn layers. Superconductor Science and Technology. 2024, 37 (3), 35019-. https://doi.org/10.1088/1361-6668/ad2982

(BibTeX)

説明:

(abstract)

In this article, the grain morphologies of Ti–Hf and Ta–Hf-doped Nb3Sn layers were clarified by scanning transmission electron microscopy (STEM) and TEM-based automated crystal orientation mapping (ACOM-TEM). STEM/energy dispersive X-ray spectroscopy (EDS) revealed no significant oxide precipitates in our samples. The grain size distribution was attained by ACOM-TEM. One remarkable new finding through STEM/EDS was the presence of a Cu–Hf compound phase in the Nb3Sn layer. The large Cu deposition on the grain boundaries might facilitate grain growth in Nb3Sn.

権利情報: