Article In-depth S/TEM observation of Ti–Hf and Ta–Hf-doped Nb3Sn layers

Nobuya Banno SAMURAI ORCID (National Institute for Materials Science) ; Taku Moronaga SAMURAI ORCID (National Institute for Materials Science) ; Toru Hara SAMURAI ORCID (National Institute for Materials Science) ; Koki Asai ; Tsuyoshi Yagai ORCID

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Nobuya Banno, Taku Moronaga, Toru Hara, Koki Asai, Tsuyoshi Yagai. In-depth S/TEM observation of Ti–Hf and Ta–Hf-doped Nb3Sn layers. Superconductor Science and Technology. 2024, 37 (3), 35019-. https://doi.org/10.1088/1361-6668/ad2982
SAMURAI

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(abstract)

In this article, the grain morphologies of Ti–Hf and Ta–Hf-doped Nb3Sn layers were clarified by scanning transmission electron microscopy (STEM) and TEM-based automated crystal orientation mapping (ACOM-TEM). STEM/energy dispersive X-ray spectroscopy (EDS) revealed no significant oxide precipitates in our samples. The grain size distribution was attained by ACOM-TEM. One remarkable new finding through STEM/EDS was the presence of a Cu–Hf compound phase in the Nb3Sn layer. The large Cu deposition on the grain boundaries might facilitate grain growth in Nb3Sn.

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Keyword: Nb3Sn, Hf doping, ACOM-TEM, TEM, grain growth

Date published: 2024-03-01

Publisher: IOP Publishing

Journal:

  • Superconductor Science and Technology (ISSN: 09532048) vol. 37 issue. 3 p. 35019-

Funding:

  • JSPS KAKENHI JP23K04453

Manuscript type: Author's version (Accepted manuscript)

MDR DOI: https://doi.org/10.48505/nims.4475

First published URL: https://doi.org/10.1088/1361-6668/ad2982

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Updated at: 2025-02-14 12:31:24 +0900

Published on MDR: 2025-02-14 12:31:24 +0900

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