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Article and Dataset
Collection
MDR XAFS DB(2)
Resource type
Journal article(4)
Dataset(2)
Keyword
Silicon (6)
BL-10 (2)
Pure metal (2)
Pure metalloid (2)
Ritsumeikan-SR (2)
Si (2)
Si K-edge (2)
XAFS (2)
collection - MDR XAFS DB (2)
All-dielectric (1)
(more)
License
Creative Commons BY Attribution 4.0 International (5)
In Copyright (1)
File type
application/pdf (4)
application/json (2)
application/octet-stream (2)
image/png (2)
text/tab-separated-values (2)
Chemical composition
Silicon (2)
Analysis field
spectroscopy (2)
Measurement method
x-ray absorption spectroscopy (2)
Material type
Pure metalloid (2)
Structural feature for specimen
local structure (2)
Keyword: Silicon
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6 records found.
A model reasoning low-energy track-formation and enhanced nuclear energy loss in Si irradiated with C60 ions
Journal article
Creator
H. Amekura
(author) (
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)
https://orcid.org/0000-0003-2148-8431
NIMS Researchers Directory SAMURAI
H. Amekura
;
K. Narumi
(author) (
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)
https://orcid.org/0000-0001-8569-0108
(unauthenticated)
K. Narumi
;
A. Chiba
(author) (
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)
A. Chiba
;
Y. Hirano
(author) (
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)
Y. Hirano
;
K. Yamada
(author) (
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)
K. Yamada
;
S. Yamamoto
(author) (
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)
S. Yamamoto
;
Y. Saitoh
(author) (
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)
Y. Saitoh
;
H. Segawa
(author) (
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)
https://orcid.org/0000-0002-7198-8410
NIMS Researchers Directory SAMURAI
H. Segawa
Keyword
ion track
,
C60 ion
,
Silicon
,
Synergy effect
,
Cluster effect
Date published
2026-06-17
Updated at
2026-06-18 14:50:54 +0900
Analyses of oxygen precipitates in CZ-Si by X-ray diffuse scattering using parallel X-ray beam
Journal article
Creator
Tomoyuki Horikawa
(author) (
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)
Tomoyuki Horikawa
;
Yoshiyuki Tsusaka
(author) (
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)
Yoshiyuki Tsusaka
;
Junji Matsui
(author) (
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)
Junji Matsui
;
Tetsuya Tohei
(author) (
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)
Tetsuya Tohei
;
Yusuke Hayashi
(author) (
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)
https://orcid.org/0000-0001-5672-1497
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
Yusuke Hayashi
;
Akira Sakai
(author) (
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)
Akira Sakai
Keyword
Silicon
,
X-ray diffuse scattering
Date published
2025-04-01
Updated at
2026-02-14 21:58:00 +0900
Dislocation cluster generation behavior in multicrystalline silicon investigated using twin network analysis
Journal article
Creator
Kazuma Torii
(author) (
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)
a Graduate School of Engineering, Nagoya University
Kazuma Torii
;
Takuto Kojima
(author) (
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)
Takuto Kojima
;
Kentaro Kutsukake
(author) (
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)
Kentaro Kutsukake
;
Hiroaki Kudo
(author) (
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)
Hiroaki Kudo
;
Noritaka Usami
(author) (
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)
Noritaka Usami
Keyword
Silicon
,
dislocation
,
twin grain boundary
,
network analysis
Date published
2025-12-31
Updated at
2025-07-16 16:14:54 +0900
Low-Contrast BIC Metasurfaces with Quality Factors Exceeding 100,000
Journal article
Creator
Keisuke Watanabe
(author) (
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)
https://orcid.org/0000-0002-4285-2135
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
Keisuke Watanabe
;
Tadaaki Nagao
(author) (
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)
https://orcid.org/0000-0002-6746-2686
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
Tadaaki Nagao
;
Masanobu Iwanaga
(author) (
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)
https://orcid.org/0000-0002-8930-6940
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
Masanobu Iwanaga
Keyword
Metasurfaces
,
Bound states in the continuum
,
Q factors
,
All-dielectric
,
Silicon
,
Biosensors
Date published
2025-02-19
Updated at
2025-02-23 22:49:30 +0900
XAFS spectrum of Silicon
Dataset
Collection
MDR XAFS DB
Creator
Masashi Ishii
(editor) (
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)
https://orcid.org/0000-0003-0357-2832
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
Masashi Ishii
;
Ritsumeikan SR Center
(author) (
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)
Ritsumeikan University
Ritsumeikan SR Center
Keyword
Silicon (powder)
,
Si
,
Si K-edge
,
Pure metal
,
BL-10
,
Ritsumeikan-SR
,
XAFS
,
collection - MDR XAFS DB
,
Silicon
,
Pure metalloid
Date published
Updated at
2025-05-02 21:46:28 +0900
XAFS spectrum of Silicon
Dataset
Collection
MDR XAFS DB
Creator
Masashi Ishii
(editor) (
Search by this author
)
https://orcid.org/0000-0003-0357-2832
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
Masashi Ishii
;
Ritsumeikan SR Center
(author) (
Search by this author
)
Ritsumeikan University
Ritsumeikan SR Center
Keyword
Silicon (wafer)
,
Si
,
Si K-edge
,
Pure metal
,
BL-10
,
Ritsumeikan-SR
,
XAFS
,
collection - MDR XAFS DB
,
Silicon
,
Pure metalloid
Date published
Updated at
2025-05-02 21:52:42 +0900
Keyword
Silicon
(6)
BL-10
(2)
Pure metal
(2)
Pure metalloid
(2)
Ritsumeikan-SR
(2)
Si
(2)
Si K-edge
(2)
XAFS
(2)
collection - MDR XAFS DB
(2)
All-dielectric
(1)
Biosensors
(1)
Bound states in the continuum
(1)
C60 ion
(1)
Cluster effect
(1)
Metasurfaces
(1)
Q factors
(1)
Silicon (powder)
(1)
Silicon (wafer)
(1)
Synergy effect
(1)
X-ray diffuse scattering
(1)
dislocation
(1)
ion track
(1)
network analysis
(1)
twin grain boundary
(1)
RDE metadata def
RDE invoice schema
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