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Resource type
Journal article(2)
Keyword
MoS2 transistors (2)
Passivation layer (1)
Van der Waals devices (1)
atomic force microscopy (1)
fluorinated graphene (1)
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Creative Commons BY Attribution 4.0 International (1)
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Keyword: MoS2 transistors
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2 records found.
Fluorinated Graphene Contacts and Passivation Layer for MoS
2
Field Effect Transistors
Journal article
Creator
Huije Ryu
(author) (
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)
Huije Ryu
;
Dong‐Hyun Kim
(author) (
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)
Dong‐Hyun Kim
;
Junyoung Kwon
(author) (
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)
Junyoung Kwon
;
Sang Kyu Park
(author) (
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)
Sang Kyu Park
;
Wanggon Lee
(author) (
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)
Wanggon Lee
;
Hyungtak Seo
(author) (
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)
Hyungtak Seo
;
Kenji Watanabe
(author) (
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)
https://orcid.org/0000-0003-3701-8119
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
Kenji Watanabe
;
Takashi Taniguchi
(author) (
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)
https://orcid.org/0000-0002-1467-3105
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
Takashi Taniguchi
;
SunPhil Kim
(author) (
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)
SunPhil Kim
;
Arend M. van der Zande
(author) (
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)
Arend M. van der Zande
;
Jangyup Son
(author) (
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)
Jangyup Son
;
Gwan‐Hyoung Lee
(author) (
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)
Gwan‐Hyoung Lee
Keyword
Passivation layer
,
fluorinated graphene
,
MoS2 transistors
Date published
2022-03-09
Updated at
2025-02-26 08:30:36 +0900
Tip-Based Cleaning and Smoothing Improves Performance in Monolayer MoS
2
Devices
Journal article
Creator
Sihan Chen
(author) (
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)
Sihan Chen
;
Jangyup Son
(author) (
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)
Jangyup Son
;
Siyuan Huang
(author) (
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)
Siyuan Huang
;
Kenji Watanabe
(author) (
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)
https://orcid.org/0000-0003-3701-8119
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
Kenji Watanabe
;
Takashi Taniguchi
(author) (
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)
https://orcid.org/0000-0002-1467-3105
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
Takashi Taniguchi
;
Rashid Bashir
(author) (
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)
Rashid Bashir
;
Arend M. van der Zande
(author) (
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)
Arend M. van der Zande
;
William P. King
(author) (
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)
William P. King
Keyword
Van der Waals devices
,
atomic force microscopy
,
MoS2 transistors
Date published
2021-02-09
Updated at
2025-03-03 16:30:23 +0900
Keyword
MoS2 transistors
(2)
Passivation layer
(1)
Van der Waals devices
(1)
atomic force microscopy
(1)
fluorinated graphene
(1)
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