3 records found.
Influence of Fermi level pinning on contact potential difference measurements using Kelvin probe force microscopy
- Journal article
- Creator
-
Nobuyuki Ishida (author) (Search by this author)
- Keyword
- Kelvin probe force microscopy, Simulation, Electrostatic force, Fermi level pinning
- Date published
- 2025-03-07
- Updated at
- 2025-03-10 16:30:14 +0900
Quantitative theoretical analysis of the electrostatic force between a metallic tip and semiconductor surface in Kelvin probe force microscopy
- Journal article
- Creator
-
Nobuyuki Ishida (author) (Search by this author)National Institute for Materials Science
;
Takaaki Mano (author) (Search by this author)National Institute for Materials Science
- Keyword
- Kelvin probe force microscopy, Simulation, GaAs(110)
- Date published
- 2025-02-17
- Updated at
- 2025-12-03 08:30:21 +0900
Quantitative characterization of built-in potential profile across GaAs p–n junctions using Kelvin probe force microscopy with qPlus sensor AFM
- Journal article
- Creator
-
Nobuyuki Ishida (author) (Search by this author)National Institute for Materials Science
;
Takaaki Mano (author) (Search by this author)National Institute for Materials Science
- Keyword
- GaAs(110), Kelvin probe force microscopy, p-n junction, qPlus sensor
- Date published
- 2024-02-05
- Updated at
- 2024-04-04 08:30:11 +0900