4 records found.
A model reasoning low-energy track-formation and enhanced nuclear energy loss in Si irradiated with C60 ions
- Journal article
- Creator
-
H. Amekura (author) (Search by this author)
;
K. Narumi (author) (Search by this author)
https://orcid.org/0000-0001-8569-0108
(unauthenticated)
;
;A. Chiba (author) (Search by this author);Y. Hirano (author) (Search by this author);K. Yamada (author) (Search by this author);S. Yamamoto (author) (Search by this author);Y. Saitoh (author) (Search by this author)H. Segawa (author) (Search by this author)
- Keyword
- ion track, C60 ion, Silicon, Synergy effect, Cluster effect
- Date published
- 2026-06-17
- Updated at
- 2026-06-18 14:50:54 +0900
An extraordinarily low-energy threshold of less than 60 keV for ion track formation in silicon
- Journal article
- Creator
-
H. Amekura (author) (Search by this author)
;
;K. Narumi (author) (Search by this author)QST;A. Chiba (author) (Search by this author)QST;Y. Hirano (author) (Search by this author)QST;K. Yamada (author) (Search by this author)QST;S. Yamamoto (author) (Search by this author)QSTY. Saitoh (author) (Search by this author)QST
- Keyword
- ion track, C60 ion, silicon, cluster effect, swift heavy ion
- Date published
- 2024-12-09
- Updated at
- 2025-01-21 12:30:27 +0900
Latent ion tracks were finally observed in diamond
- Journal article
- Creator
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H. Amekura (author) (Search by this author)National Institute for Materials Science
;
A. Chettah (author) (Search by this author)
https://orcid.org/0000-0002-9815-0992
(unauthenticated)
;
K. Narumi (author) (Search by this author)
https://orcid.org/0000-0001-8569-0108
(unauthenticated)
;
;A. Chiba (author) (Search by this author);Y. Hirano (author) (Search by this author);K. Yamada (author) (Search by this author);S. Yamamoto (author) (Search by this author)A. A. Leino (author) (Search by this author)
https://orcid.org/0000-0003-3504-548X
(unauthenticated)
;
F. Djurabekova (author) (Search by this author)
https://orcid.org/0000-0002-5828-200X
(unauthenticated)
;
K. Nordlund (author) (Search by this author)
https://orcid.org/0000-0001-6244-1942
(unauthenticated)
;
;N. Ishikawa (author) (Search by this author);N. Okubo (author) (Search by this author)Y. Saitoh (author) (Search by this author)
- Keyword
- ion track, diamond, C60 ion, transmission electron microscopy, velocity effect
- Date published
- 2024-02-27
- Updated at
- 2024-03-04 16:30:07 +0900
Mechanism of ion track formation in silicon by much lower energy deposition than the formation threshold
- Journal article
- Creator
-
H Amekura (author) (Search by this author)National Institute for Materials Science
;
;K Narumi (author) (Search by this author);A Chiba (author) (Search by this author);Y Hirano (author) (Search by this author);K Yamada (author) (Search by this author);S Yamamoto (author) (Search by this author);N Ishikawa (author) (Search by this author);N Okubo (author) (Search by this author);M Toulemonde (author) (Search by this author)Y Saitoh (author) (Search by this author)
- Keyword
- C60 ion, ion track, swift heavy ion, silicon, synergy effect, track recrystallization
- Date published
- 2023-04-01
- Updated at
- 2024-01-05 22:12:20 +0900