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Journal article(2)
Software(1)
Keyword
4DSTEM (3)
Wigner distribution deconvolution (1)
aberration correction (1)
electron microscopy (1)
electron ptychography (1)
phase retrieval (1)
ptychography (1)
タイコグラフィー (1)
位相回復 (1)
回折顕微法 (1)
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In Copyright (2)
http://opensource.org/licenses/MIT (1)
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application/pdf (2)
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image/tiff (1)
text/troff (1)
Measurement method
scanning transmission electron microscopy (1)
Keyword: 4DSTEM
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4D STEM計測とタイコグラフィー
Journal article
Creator
三石 和貴
(author) (
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)
https://orcid.org/0000-0002-9361-4057
マテリアル基盤研究センター, 物質・材料研究機構
NIMS Researchers Directory SAMURAI
三石 和貴
;
中澤 克昭
(author) (
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)
https://orcid.org/0000-0002-6056-5615
若手国際研究センター, 物質・材料研究機構
NIMS Researchers Directory SAMURAI
中澤 克昭
Keyword
4DSTEM
,
electron ptychography
,
phase retrieval
Date published
[2025年5月]
Updated at
2025-12-25 15:51:02 +0900
電子線タイコグラフィー入門
Journal article
Creator
三石 和貴
(author) (
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)
https://orcid.org/0000-0002-9361-4057
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
三石 和貴
;
中澤 克昭
(author) (
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)
中澤 克昭
;
清水 雅彦
(author) (
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)
https://orcid.org/0009-0009-3107-6829
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
清水 雅彦
Keyword
タイコグラフィー
,
4DSTEM
,
位相回復
,
回折顕微法
Date published
Updated at
2026-04-30 12:01:11 +0900
Ptychographical reconstruction code by Wigner Distribution Deconvolution (WDD)
Software
Creator
Nakazawa Katsuaki
(author) (
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https://orcid.org/0000-0002-6056-5615
ICYS, National Institute for Materials Science
NIMS Researchers Directory SAMURAI
Nakazawa Katsuaki
;
Mitsuishi Kazutaka
(author) (
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)
https://orcid.org/0000-0002-9361-4057
Research Center for Advanced Measurement and Characterization, National Institute for Materials Science
NIMS Researchers Directory SAMURAI
Mitsuishi Kazutaka
Keyword
ptychography
,
4DSTEM
,
electron microscopy
,
Wigner distribution deconvolution
,
aberration correction
Date published
2022-11-30
Updated at
2023-02-03 17:43:11 +0900
Keyword
4DSTEM
(3)
Wigner distribution deconvolution
(1)
aberration correction
(1)
electron microscopy
(1)
electron ptychography
(1)
phase retrieval
(1)
ptychography
(1)
タイコグラフィー
(1)
位相回復
(1)
回折顕微法
(1)
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Collection
Resource type
Journal article(2)
Software(1)
Keyword
4DSTEM (3)
Wigner distribution deconvolution (1)
aberration correction (1)
electron microscopy (1)
electron ptychography (1)
phase retrieval (1)
ptychography (1)
タイコグラフィー (1)
位相回復 (1)
回折顕微法 (1)
(more)
License
In Copyright (2)
http://opensource.org/licenses/MIT (1)
File type
application/pdf (2)
application/octet-stream (1)
image/tiff (1)
text/troff (1)
Measurement method
scanning transmission electron microscopy (1)