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Journal article(1)
Software(1)
Keyword
4DSTEM (2)
Wigner distribution deconvolution (1)
aberration correction (1)
electron microscopy (1)
electron ptychography (1)
phase retrieval (1)
ptychography (1)
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scanning transmission electron microscopy (1)
Keyword: 4DSTEM
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2 records found.
4D STEM計測とタイコグラフィー
Journal article
Creator
三石 和貴
(author) (
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)
https://orcid.org/0000-0002-9361-4057
マテリアル基盤研究センター, 物質・材料研究機構
NIMS Researchers Directory SAMURAI
三石 和貴
;
中澤 克昭
(author) (
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)
https://orcid.org/0000-0002-6056-5615
若手国際研究センター, 物質・材料研究機構
NIMS Researchers Directory SAMURAI
中澤 克昭
Keyword
4DSTEM
,
electron ptychography
,
phase retrieval
Date published
[2025年5月]
Updated at
2025-12-25 15:51:02 +0900
Ptychographical reconstruction code by Wigner Distribution Deconvolution (WDD)
Software
Creator
Nakazawa Katsuaki
(author) (
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)
https://orcid.org/0000-0002-6056-5615
ICYS, National Institute for Materials Science
NIMS Researchers Directory SAMURAI
Nakazawa Katsuaki
;
Mitsuishi Kazutaka
(author) (
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)
https://orcid.org/0000-0002-9361-4057
Research Center for Advanced Measurement and Characterization, National Institute for Materials Science
NIMS Researchers Directory SAMURAI
Mitsuishi Kazutaka
Keyword
ptychography
,
4DSTEM
,
electron microscopy
,
Wigner distribution deconvolution
,
aberration correction
Date published
2022-11-30
Updated at
2023-02-03 17:43:11 +0900
Keyword
4DSTEM
(2)
Wigner distribution deconvolution
(1)
aberration correction
(1)
electron microscopy
(1)
electron ptychography
(1)
phase retrieval
(1)
ptychography
(1)
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