4 件のレコードが見つかりました。
Experimental investigation and simulation of SEM image intensity behaviors for developing thickness-controlled S/TEM lamella preparation via FIB-SEM
- ジャーナル論文
- 著者
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Jun Uzuhashi (author) (この著者で検索)
;
;Yuanzhao Yao (author) (この著者で検索)Tadakatsu Ohkubo (author) (この著者で検索)
;
Takashi Sekiguchi (author) (この著者で検索) - キーワード
- transmission electron microscopy, scanning electron microscopy, focused ion beam
- 刊行年月日
- 2025-08-01
- 更新時刻
- 2026-01-31 16:30:04 +0900
Nanowire Electrode Structures Enhanced Direct Extracellular Electron Transport via Cell-Surface Multi-Heme Cytochromes in Desulfovibrio ferrophilus IS5
- ジャーナル論文
- 著者
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Xiao Deng (author) (この著者で検索)National Institute for Materials Science
;
Wipakorn Jevasuwan (author) (この著者で検索)National Institute for Materials Science
;
Naoki Fukata (author) (この著者で検索)National Institute for Materials Science
;
Akihiro Okamoto (author) (この著者で検索)National Institute for Materials Science
- キーワード
- cell attachment, differential pulse voltammetry, electrochemical analysis, nanostructure, outer-membrane cytochrome, scanning electron microscopy
- 刊行年月日
- 2024-08-13
- 更新時刻
- 2024-09-03 08:30:25 +0900
An Automated Site-Specific Tip Preparation Method for Atom Probe Tomography Using Script-Controlled Focused Ion Beam/Scanning Electron Microscopy
- ジャーナル論文
- 著者
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Jun Uzuhashi (author) (この著者で検索)
;
Tadakatsu Ohkubo (author) (この著者で検索)
;
Kazuhiro Hono (author) (この著者で検索)
- キーワード
- atom probe tomography, focused ion beam, scanning electron microscopy
- 刊行年月日
- 2025-02-03
- 更新時刻
- 2024-09-05 08:30:18 +0900
Development of automated tip preparation for atom probe tomography by using script-controlled FIB-SEM
- ジャーナル論文
- 著者
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Jun Uzuhashi (author) (この著者で検索)National Institute for Materials Science
;
Tadakatsu Ohkubo (author) (この著者で検索)National Institute for Materials Science
;
Kazuhiro Hono (author) (この著者で検索)National Institute for Materials Science
- キーワード
- atom probe tomography, focused ion beam, scanning electron microscopy, automation
- 刊行年月日
- 2023-02-19
- 更新時刻
- 2025-02-23 22:51:16 +0900