3 件のレコードが見つかりました。
Approaching the Intrinsic Properties of Moiré Structures Using Atomic Force Microscopy Ironing
- ジャーナル論文
- 著者
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;Swaroop Kumar Palai (author) (この著者で検索);Mateusz Dyksik (author) (この著者で検索);Nikodem Sokolowski (author) (この著者で検索);Mariusz Ciorga (author) (この著者で検索);Estrella Sánchez Viso (author) (この著者で検索);Yong Xie (author) (この著者で検索);Alina Schubert (author) (この著者で検索)Takashi Taniguchi (author) (この著者で検索)National Institute for Materials Science
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Kenji Watanabe (author) (この著者で検索)National Institute for Materials Science
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;Duncan K. Maude (author) (この著者で検索);Alessandro Surrente (author) (この著者で検索);Michał Baranowski (author) (この著者で検索);Andres Castellanos-Gomez (author) (この著者で検索);Carmen Munuera (author) (この著者で検索)Paulina Plochocka (author) (この著者で検索) - キーワード
- Transition metal dichalcogenides, moiré pattern, atomic force microscope
- 刊行年月日
- 2023-06-14
- 更新時刻
- 2025-02-15 12:30:13 +0900
High-Quality Three-Dimensionally Cultured Cells Using Interfaces of Diblock Copolymers Containing Different Ratios of Zwitterionic N‑Oxides
- ジャーナル論文
- 著者
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;Naoto Ogiwara (author) (この著者で検索)Department of Bioengineering, School of Engineering, The University of Tokyo;Takenobu Nakano (author) (この著者で検索)Biotech Business Unit, Incubation Center, artience Co., Ltd.;Koki Baba (author) (この著者で検索)Biotech Business Unit, Incubation Center, artience Co., Ltd.Hidenori Noguchi (author) (この著者で検索)National Institute for Materials Science Research Center for Energy and Environmental Materials (GREEN)/Battery and Cell Materials Field/Interface Electrochemistry Group
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;Tsukuru Masuda (author) (この著者で検索)Department of Bioengineering, School of Engineering, The University of TokyoMadoka Takai (author) (この著者で検索)Department of Bioengineering, School of Engineering, The University of Tokyo
- キーワード
- cell spheroid, N-oxide, diblock copolymer, protein adsorption, atomic force microscope, sum frequency generation
- 刊行年月日
- 2024-08-28
- 更新時刻
- 2025-08-19 08:30:21 +0900
Depth Profiling Analysis of InP/GaInAsP Multilayers by Auger Electron Spectroscopy, Quantitative Evaluation of the Surface Roughness Caused by Ion Sputtering
- ジャーナル論文
- 著者
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OGIWARA, Toshiya (author) (この著者で検索)
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TANUMA, Shigeo (author) (この著者で検索)
- キーワード
- depth resolution function, InP/GaInAsP multilayer specimens, Auger depth profiling analysis, surface roughness, atomic force microscope
- 刊行年月日
- 2011-06-10
- 更新時刻
- 2022-10-03 01:24:02 +0900