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説明:

We provide images of electron flow from a collimating contact that directly show the width and shape of the electron beam, obtained using a Scanning Gate Microscope (SGM) cooled to 4.2 K. The device is a hBN-encapsulated graphene hall bar with narrow side contacts on either side of the channel that have an electron emitter at the end and absorbing zig-zag contacts at both side. To form an image of electron flow, the SGM tip is raster scanned at a constant height above the sample surface while the transmission to a receiving contact on opposite sides of the channel is measured. The SGM tip creates a capacitive image charge in the graphene sheet that deflects electrons away from their original paths, changing the transmission T.

権利情報:

• https://creativecommons.org/licenses/by/3.0/legalcode
  

キーワード: Ballistic electrons, graphene, electron-optic devices

刊行年月日: 2018-03-22

出版者: IOP Publishing

掲載誌:

• 2D Materials (ISSN: 20531583) vol. 5 issue. 2 021003

研究助成金:

• Basic Energy Sciences DE-FG02-07ER46422
• National Institute for Materials Science Grant-in-Aid for Scientific Researc
• National Research Foundation of Korea Global Research Laboratory Program/
• National Science Foundation ECCS-1541959

原稿種別: 出版者版 (Version of record)

MDR DOI:

公開URL: https://doi.org/10.1088/2053-1583/aab38a

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更新時刻: 2025-02-23 22:49:11 +0900

MDRでの公開時刻: 2025-02-23 22:49:11 +0900