S Bhandari
;
G H Lee
;
K Watanabe
(National Institute for Materials Science)
;
T Taniguchi
(National Institute for Materials Science)
;
P Kim
;
R M Westervelt
Description:
(abstract)We provide images of electron flow from a collimating contact that directly show the width and shape of the electron beam, obtained using a Scanning Gate Microscope (SGM) cooled to 4.2 K. The device is a hBN-encapsulated graphene hall bar with narrow side contacts on either side of the channel that have an electron emitter at the end and absorbing zig-zag contacts at both side. To form an image of electron flow, the SGM tip is raster scanned at a constant height above the sample surface while the transmission to a receiving contact on opposite sides of the channel is measured. The SGM tip creates a capacitive image charge in the graphene sheet that deflects electrons away from their original paths, changing the transmission T.
Rights:
Keyword: Ballistic electrons, graphene, electron-optic devices
Date published: 2018-03-22
Publisher: IOP Publishing
Journal:
Funding:
Manuscript type: Publisher's version (Version of record)
MDR DOI:
First published URL: https://doi.org/10.1088/2053-1583/aab38a
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Updated at: 2025-02-23 22:49:11 +0900
Published on MDR: 2025-02-23 22:49:11 +0900
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