Article Imaging electron flow from collimating contacts in graphene

S Bhandari ; G H Lee ; K Watanabe SAMURAI ORCID (National Institute for Materials Science) ; T Taniguchi SAMURAI ORCID (National Institute for Materials Science) ; P Kim ; R M Westervelt

Collection

Citation
S Bhandari, G H Lee, K Watanabe, T Taniguchi, P Kim, R M Westervelt. Imaging electron flow from collimating contacts in graphene. 2D Materials. 2018, 5 (2), 021003.
SAMURAI

Description:

(abstract)

We provide images of electron flow from a collimating contact that directly show the width and shape of the electron beam, obtained using a Scanning Gate Microscope (SGM) cooled to 4.2 K. The device is a hBN-encapsulated graphene hall bar with narrow side contacts on either side of the channel that have an electron emitter at the end and absorbing zig-zag contacts at both side. To form an image of electron flow, the SGM tip is raster scanned at a constant height above the sample surface while the transmission to a receiving contact on opposite sides of the channel is measured. The SGM tip creates a capacitive image charge in the graphene sheet that deflects electrons away from their original paths, changing the transmission T.

Rights:

Keyword: Ballistic electrons, graphene, electron-optic devices

Date published: 2018-03-22

Publisher: IOP Publishing

Journal:

  • 2D Materials (ISSN: 20531583) vol. 5 issue. 2 021003

Funding:

  • Basic Energy Sciences DE-FG02-07ER46422
  • National Institute for Materials Science Grant-in-Aid for Scientific Researc
  • National Research Foundation of Korea Global Research Laboratory Program/
  • National Science Foundation ECCS-1541959

Manuscript type: Publisher's version (Version of record)

MDR DOI:

First published URL: https://doi.org/10.1088/2053-1583/aab38a

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Updated at: 2025-02-23 22:49:11 +0900

Published on MDR: 2025-02-23 22:49:11 +0900

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