Yi Liu
;
Zhun-Yong Ong
;
Jing Wu
;
Yunshan Zhao
;
Kenji Watanabe
(National Institute for Materials Science
)
;
Takashi Taniguchi
(National Institute for Materials Science
)
;
Dongzhi Chi
;
Gang Zhang
;
John T. L. Thong
;
Cheng-Wei Qiu
;
Kedar Hippalgaonkar
説明:
(abstract)We measure the thermal conductance at the 2D MoS2/h-BN interface by Joule heating a monolayer MoS2 to generate a vertical temperature gradient across the heterostructure. Raman spectroscopy is used to measure the temperatures of MoS2 and h-BN independently. We obtain an interface thermal conductance of 17 MW/m2K at 300 K. Our calculations, from which the transmission spectrum can be obtained, show that the discrepancy of thermal conductance for the interface is due to the weaker cross-plane transmission of phonon modes from MoS2 to h-BN. Our study demonstrates that the MoS2/h-BN interface limits cross-plane heat dissipation, and thereby it could impact the design and applications of MoS2/h-BN based devices where thermal management is critical.
権利情報:
キーワード: 2D materials, thermal management, interface conductance
刊行年月日: 2017-03-06
出版者: Springer Science and Business Media LLC
掲載誌:
研究助成金:
原稿種別: 出版者版 (Version of record)
MDR DOI:
公開URL: https://doi.org/10.1038/srep43886
関連資料:
その他の識別子:
連絡先:
更新時刻: 2025-03-01 08:30:24 +0900
MDRでの公開時刻: 2025-03-01 08:30:24 +0900
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srep43886.pdf
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application/pdf |
サイズ | 1.06MB | 詳細 |