Xun Liu
(National Institute for Materials Science)
;
Lihao Yang
;
Zhufeng Hou
;
Bo Da
(National Institute for Materials Science
)
;
Kenji Nagata
(National Institute for Materials Science
)
;
Hideki Yoshikawa
(National Institute for Materials Science
)
;
Shigeo Tanuma
(National Institute for Materials Science
)
;
Yang Sun
;
Zejun Ding
Description:
(abstract)The prediction of electron inelastic mean free paths (IMFPs) from simple material parameters is a challenging problem in studies using electron spectroscopy and microscopy. Herein, we propose a machine learning approach to predict IMFPs from some basic material property data. The machine learning model showed excellent performance based on the calculated IMFPs for a group of 41 elemental materials (Li, Be, C (graphite), C (diamond), C (glassy), Na, Mg, Al, Si, K, Sc, Ti, V, Cr, Fe, Co, Ni, Cu, Ge, Y, Nb, Mo, Ru, Rh, Pd, Ag, In, Sn, Cs, Gd, Tb, Dy, Hf, Ta, W, Re, Os, Ir, Pt, Au, Bi) from our previous work by Shinotsuka et al., which was comparable to that of the robust TPP-2M formula (by Tanuma, Powell and Penn). The developed machine learning model was then extended to materials that do not have reported IMFPs in the Shinotsuka et al. database.
Rights:
Keyword: machine learning, inelastic mean free path
Date published: 2021-03-24
Publisher: American Physical Society (APS)
Journal:
Funding:
Manuscript type: Author's version (Accepted manuscript)
MDR DOI: https://doi.org/10.48505/nims.3953
First published URL: https://doi.org/10.1103/PhysRevMaterials.5.033802
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Updated at: 2024-01-05 22:13:49 +0900
Published on MDR: 2023-04-11 10:40:43 +0900
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