M. Kotrla
(Research Center for Electronic and Optical Materials/Functional Materials Field/Electro-ceramics Group, National Institute for Materials Science)
;
H. Segawa
(Research Center for Electronic and Optical Materials, National Institute for Materials Science)
;
T. Ohsawa
(Research Center for Electronic and Optical Materials/Functional Materials Field/Electro-ceramics Group, National Institute for Materials Science)
;
Y. Matsushita
(Research Network and Facility Services Division/Materials Fabrication and Analysis Platform/Surface and Bulk Analysis Unit, National Institute for Materials Science)
;
P. Janíček
(University of Pardubice)
;
J. Gutwirth
(University of Pardubice)
;
V. Nazabal
(University of Rennes)
;
Č. Drašar
(University of Pardubice)
;
P. Němec
(University of Pardubice)
Description:
(abstract)Sn-Se薄膜の相変化について調査した。
Rights:
Keyword: Phase-change, Sn-Se, Pulsed laser deposition, Thin films, Localization of electrical charge
Date published: 2024-11-20
Publisher: Elsevier Ltd
Journal:
Funding:
Manuscript type: Author's version (Submitted manuscript)
MDR DOI: https://doi.org/10.48505/nims.5985
First published URL: https://doi.org/10.1016/j.ceramint.2024.11.286
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Other identifier(s):
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Updated at: 2025-12-10 16:30:14 +0900
Published on MDR: 2025-12-10 16:25:19 +0900
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manuscript Ceram Int R2.docx
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application/vnd.openxmlformats-officedocument.wordprocessingml.document |
Size | 1.63 MB | Detail |