説明:
(abstract)In this study, we have investigated the growth behavior of SnSₓ thin films by molecular beam deposition using a plasma-cracked sulfur source to explore the influence of sulfur chemical activity on phase formation and stability. Plasma activation of elemental sulfur enabled the successful formation of stoichiometric and crystalline SnS at moderate substrate temperatures, while uncracked S₈ resulted in sulfur-deficient films. Furthermore, under higher sulfur flux and lower thermal budget, crystalline SnS₂ formation was observed. The phase selectivity was systematically evaluated through Raman spectroscopy, X-ray diffraction, and AES, and the desorption behavior of SnS correlated well with reported vapor pressure data. These findings demonstrate that plasma cracking enhances sulfur reactivity and enables access to distinct tin sulfide phases depending on growth conditions. These results and discussions provide a basis for understanding SnSx thin-film growth and points toward future development of phase-selective IV-VI chalcogenide thin-film growth technique.
権利情報:
This is the Accepted Manuscript version of an article accepted for publication in Japanese Journal of Applied Physics. IOP Publishing Ltd is not responsible for any errors or omissions in this version of the manuscript or any version derived from it. The Version of Record is available online at https://doi.org/10.35848/1347-4065/adf3be.
キーワード: germanium sulfide
刊行年月日: 2025-08-01
出版者: IOP Publishing
掲載誌:
研究助成金:
原稿種別: 著者最終稿 (Accepted manuscript)
MDR DOI: https://doi.org/10.48505/nims.5815
公開URL: https://doi.org/10.35848/1347-4065/adf3be
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更新時刻: 2025-10-16 14:01:13 +0900
MDRでの公開時刻: 2026-08-11 08:25:49 +0900
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