Article In situ Transmission Electron Microscopy Observation of Melted Germanium Encapsulated in Multilayer Graphene

Seiya Suzuki SAMURAI ORCID (Advanced Science Research Center (ASRC), Japan Atomic Energy Agency (JAEA)) ; Yoshihiro Nemoto (Electron Microscopy Analysis Station, National Institute for Materials Science (NIMS)) ; Natsumi Shiiki (International Center for Young Scientists (ICYS), National Institute for Materials Science (NIMS)) ; Yoshiko Nakayama (Electron Microscopy Analysis Station, National Institute for Materials Science (NIMS)) ; Masaki Takeguchi SAMURAI ORCID (Electron Microscopy Analysis Station, National Institute for Materials Science (NIMS))

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Citation
Seiya Suzuki, Yoshihiro Nemoto, Natsumi Shiiki, Yoshiko Nakayama, Masaki Takeguchi. In situ Transmission Electron Microscopy Observation of Melted Germanium Encapsulated in Multilayer Graphene. ANNALEN DER PHYSIK. 2023, 535 (), 2300122-2300122. https://doi.org/10.1002/andp.202300122
SAMURAI

Description:

(abstract)

A graphene/Ge/graphene encapsulated structure was fabricatead. In situ heating TEM revealed that Ge like droplets moved and coalesced with other Ge droplets, indicating that Ge remained as a liquid phase between graphene layers at temperatures higher than the Ge melting point. It was also observed that droplet Ge incorporates the surrounding amorphous Ge as Ge nuclei, thereby increasing its size (domain growth). These results indicated that Ge crystals can be grown at the interface of van der Waals materials, which will be important for future germanene growth at solid interfaces.

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  • In Copyright

    This is the peer reviewed version of the following article: In Situ Transmission Electron Microscopy Observation of Melted Germanium Encapsulated in Multilayer Graphene, which has been published in final form at https://doi.org/10.1002/andp.202300122 . This article may be used for non-commercial purposes in accordance with Wiley Terms and Conditions for Use of Self-Archived Versions. This article may not be enhanced, enriched or otherwise transformed into a derivative work, without express permission from Wiley or by statutory rights under applicable legislation. Copyright notices must not be removed, obscured or modified. The article must be linked to Wiley’s version of record on Wiley Online Library and any embedding, framing or otherwise making available the article or pages thereof by third parties from platforms, services and websites other than Wiley Online Library must be prohibited.

Keyword: crystal growth, germanene, germanium, in situ heating measurement, interfaces

Date published: 2023-06-29

Publisher: Wiley

Journal:

  • ANNALEN DER PHYSIK (ISSN: 00033804) vol. 535 p. 2300122-2300122

Funding:

  • JSPS 20K15134
  • PRESTO JPMJPR21B7
  • MEXT JPMXP09F19NMN010

Manuscript type: Author's version (Accepted manuscript)

MDR DOI: https://doi.org/10.48505/nims.4256

First published URL: https://doi.org/10.1002/andp.202300122

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Updated at: 2024-06-29 08:30:27 +0900

Published on MDR: 2024-06-29 08:30:27 +0900

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