Shinotsuka, H
(物質・材料研究機構)
;
TANUMA, Shigeo
(Research Network and Facility Services Division/Materials Analysis Station, National Institute for Materials Science
)
;
Powell, C. J.
(NIST)
;
Penn, D. R.
(NIST)
説明:
(abstract)We have calculated IMFPs for 41 elemental solids and 30 semiconductors at equal energy intervals on a logarithmic scale corresponding to increments of 10% from 10 eV to 200 keV. These calculations were made with optical ELFs using the relativistic full Penn algorithm. Our calculated IMFPs could be fitted to a modified relativistic Bethe equation for inelastic scattering of electron in matter for energies from 50 eV to 200 keV. The RMS deviation in these fits was 0.8% for the 41 elemental solids. The new IMFPs were also compared with IMFPs from the predictive TPP-2M equation that was modified to include relativistic effects; the average RMS deviation in these comparisons was 11.9% for the 41 elemental solids and for energies from 50 eV to 200 keV.
権利情報:
キーワード: IMFP, relativistic full Penn algorithm, Fano Plot, relativistic modified Bethe equation , Mermin-type ELF
会議:
研究助成金:
原稿種別: 論文以外のデータ
MDR DOI: https://doi.org/10.48505/nims.4204
公開URL:
関連資料:
その他の識別子:
連絡先:
更新時刻: 2023-06-29 11:47:58 +0900
MDRでの公開時刻: 2023-06-29 13:30:38 +0900
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13_IUVSTA_2013_06_v1 のコピー 2.pdf
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