Hiroo Tajiri
;
Shinji Kohara
;
Koji Kimura
;
Sekhar Halubai
;
Haruto Morimoto
;
Naohisa Happo
;
Jens R. Stellhorn
;
Yohei Onodera
;
Xvsheng Qiao
;
Daisuke Urushihara
;
Peidong Hu
;
Toru Wakihara
;
Toyohiko Kinoshita
;
Koichi Hayashi
説明:
(abstract)To tackle disorder in crystals and short- and intermediate-range order in amorphous materials, such as a glass, we developed a carry-in diffractometer to utilize X-ray fluorescence holography (XFH) and anomalous X-ray scattering (AXS), facilitating element specific-analyses with atomic resolution using the wavelength tunability of a synchrotron X-ray source. Our diffractometer unifies XFH and AXS configurations to determine the crystal orientation via diffractometry. In particular, XFH was realised even for a crystal with blurred emission lines by a standing wave in a hologram, and high-throughput AXS with sufficient count statistics and energy resolution was achieved using three multi-array detectors with crystal analysers. These features increase tractable targets by XFH and AXS, which have novel functionalities.
権利情報:
キーワード: X-ray diffractometers, element-specific measurements, X-ray fluorescence holography, anomalous X-ray scattering
刊行年月日: 2025-01-01
出版者: International Union of Crystallography (IUCr)
掲載誌:
研究助成金:
原稿種別: 出版者版 (Version of record)
MDR DOI:
公開URL: https://doi.org/10.1107/s1600577524011366
関連資料:
その他の識別子:
連絡先:
更新時刻: 2024-12-26 16:30:51 +0900
MDRでの公開時刻: 2024-12-26 16:30:51 +0900
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