Article Diffractometer for element-specific analysis on local structures using a combination of X-ray fluorescence holography and anomalous X-ray scattering

Hiroo Tajiri ORCID ; Shinji Kohara SAMURAI ORCID ; Koji Kimura ORCID ; Sekhar Halubai ; Haruto Morimoto ; Naohisa Happo ORCID ; Jens R. Stellhorn ORCID ; Yohei Onodera SAMURAI ORCID ; Xvsheng Qiao ORCID ; Daisuke Urushihara ORCID ; Peidong Hu ; Toru Wakihara ORCID ; Toyohiko Kinoshita ORCID ; Koichi Hayashi ORCID

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Citation
Hiroo Tajiri, Shinji Kohara, Koji Kimura, Sekhar Halubai, Haruto Morimoto, Naohisa Happo, Jens R. Stellhorn, Yohei Onodera, Xvsheng Qiao, Daisuke Urushihara, Peidong Hu, Toru Wakihara, Toyohiko Kinoshita, Koichi Hayashi. Diffractometer for element-specific analysis on local structures using a combination of X-ray fluorescence holography and anomalous X-ray scattering. Journal of Synchrotron Radiation. 2025, 32 (1), 125-132. https://doi.org/10.1107/s1600577524011366
SAMURAI

Description:

(abstract)

To tackle disorder in crystals and short- and intermediate-range order in amorphous materials, such as a glass, we developed a carry-in diffractometer to utilize X-ray fluorescence holography (XFH) and anomalous X-ray scattering (AXS), facilitating element specific-analyses with atomic resolution using the wavelength tunability of a synchrotron X-ray source. Our diffractometer unifies XFH and AXS configurations to determine the crystal orientation via diffractometry. In particular, XFH was realised even for a crystal with blurred emission lines by a standing wave in a hologram, and high-throughput AXS with sufficient count statistics and energy resolution was achieved using three multi-array detectors with crystal analysers. These features increase tractable targets by XFH and AXS, which have novel functionalities.

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Keyword: X-ray diffractometers, element-specific measurements, X-ray fluorescence holography, anomalous X-ray scattering

Date published: 2025-01-01

Publisher: International Union of Crystallography (IUCr)

Journal:

  • Journal of Synchrotron Radiation (ISSN: 16005775) vol. 32 issue. 1 p. 125-132

Funding:

  • Japan Society for the Promotion of Science 20H05878
  • Japan Society for the Promotion of Science 20H05880
  • Japan Society for the Promotion of Science 20H05881

Manuscript type: Publisher's version (Version of record)

MDR DOI:

First published URL: https://doi.org/10.1107/s1600577524011366

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Updated at: 2024-12-26 16:30:51 +0900

Published on MDR: 2024-12-26 16:30:51 +0900

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