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説明:

Understanding the degradation mechanisms of perovskite solar cell (PSC) is paramount to addressing stability-related issues. Photocurrent loss is widely observed in the degraded PSC. Here, we investigate the degradation of PSC by probing the thermal hysteresis of photocurrent (THPC) and the dynamics of thermally active ionic or recombination processes. Degraded devices exhibit a considerably higher degree of variation in the photogenerated current, encompassing a broad spectrum of photo-induced ionic charge accumulation. THPC reveals changes driven by the accumulation of interfacial ionic charges and active defects under photo-thermal drifting, as supported by capacitance analysis. Device simulation corroborates that the interfacial surface defect formed at the interfacial layer in the device structure wields a substantial influence on device degradation, particularly in cases of photocurrent loss. This study underscores the direct correlation between the degradation of PSC and the presence of thermally activated traps and interfacial charge accumulation emphasizing the importance of passivating these pathways to improve device stability.

権利情報:

• In Copyright
  

キーワード: Perovskite degradation, Interfacial defect, thermal hysteresis of photocurrent, Capacitance spectra, SCAPS simulation, Ion migration

刊行年月日: 2024-11-28

出版者: Elsevier BV

掲載誌:

• Solar Energy Materials and Solar Cells (ISSN: 09270248) vol. 281 113319

研究助成金:

• Kurata Memorial Hitachi Science and Technology Foundation 1572

原稿種別: 査読前原稿 (Author's original)

MDR DOI: https://doi.org/10.48505/nims.5099

公開URL: https://doi.org/10.1016/j.solmat.2024.113319

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更新時刻: 2024-12-06 17:17:44 +0900

MDRでの公開時刻: 2024-12-06 17:17:44 +0900