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Alternative title: Virtual substrate method for nanomaterials characterization

Description:

Characterization techniques available for bulk or thin-film solid-state materials have been extended to substrate-supported nanomaterials, but generally non-quantitatively. This is because the nanomaterial signals are inevitably buried in the signals from the underlying substrate in common reflection-configuration techniques. Here, we propose a virtual substrate method to characterize nanomaterials without the influence of underlying substrate signals from four interrelated measurements. The virtual substrate method represents a benchmark for surface analysis to provide “free-standing” information about supported nanomaterials.

Rights:

• Creative Commons BY Attribution 4.0 International
  

  Creative Commons BY Attribution 4.0 International

Keyword: Virtual substrate method

Date published: 2017-05-26

Publisher: Springer Science and Business Media LLC

Journal:

• NATURE COMMUNICATIONS (ISSN: 20411723) vol. 8 15629

Funding:

Manuscript type: Publisher's version (Version of record)

MDR DOI:

First published URL: https://doi.org/10.1038/ncomms15629

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Updated at: 2024-01-05 22:11:56 +0900

Published on MDR: 2023-02-28 11:37:12 +0900