Journal article Device engineering for photocurrent detected magnetic resonance and scanning probes using solid-state spin defects
Hiroki Morishita (author) (Search by this author)
a Center for Science and Innovation in Spintronics, Tohoku University
;
Naoya Morioka (author) (Search by this author)
;
Eikichi Kimura (author) (Search by this author)
;
Keigo Arai (author) (Search by this author)
;
Yuichi Yamazaki (author) (Search by this author)
;
Toshu An (author) (Search by this author)
;
Shigemi Mizukami (author) (Search by this author)
;
Norikazu Mizuochi (author) (Search by this author)
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Citation
Hiroki Morishita, Naoya Morioka, Eikichi Kimura, Keigo Arai, Yuichi Yamazaki, Toshu An, Shigemi Mizukami, Norikazu Mizuochi. Device engineering for photocurrent detected magnetic resonance and scanning probes using solid-state spin defects. Science and Technology of Advanced Materials. 2026, 27 (1), 2691682. https://doi.org/10.1080/14686996.2026.2691682

Description:

(abstract)

Solid-state spin defects provide a versatile platform for quantum sensing with nanoscale spatial resolution and room-temperature operation. Spin defects in diamond have enabled mature scanning-probe devices, while related defects in silicon carbide and hexagonal boron nitride are being actively explored for scalable sensing platforms. However, the sensitivity of practical and scanning-probe devices remains below that of optimized bulk systems. Although optical fluorescence detection is widely used, practical performance is often constrained by limitations in signal acquisition and readout efficiency, motivating continued efforts to improve readout technologies. This review surveys material platforms and optical and photoelectrical readout technologies for solid-state spin defects. We compare fluorescence- and photoelectric-based detection schemes in terms of readout fidelity, sensitivity, and scalability, and discuss how materials properties and carrier transport influence practical performance. These perspectives provide guidelines for improving readout efficiency and advancing high-sensitivity quantum sensors and scanning probes.

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Keyword: Solid-state quantum sensor, quantum spin, diamond, silicon carbide, photoelectrical detection, quantum scanning probe

Date published: 2026-12-31

Publisher: Taylor & Francis

Journal:

  • Science and Technology of Advanced Materials (ISSN: 14686996) vol. 27 issue. 1 2691682

Funding:

Manuscript type: Author's version (Accepted manuscript)

MDR DOI: https://doi.org/10.48505/nims.6474

First published URL: https://doi.org/10.1080/14686996.2026.2691682

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Updated at: 2026-08-24 14:30:47 +0900

Published on MDR: 2026-08-24 16:27:38 +0900

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