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Preparation of an Al-Ni alloy for transmission electron microscopy (TEM) by focused ion beam (FIB) milling using Ga+ ions induced phase transformations, risking misinterpretation: from FCC Al-Ni solid solution to FCC Al-Ni and orthorhombic Al3Ni phases. Upon milling a nanolaminated Al95Ni5 - AlOx thin film with Ga+ ions, local Ga segregations of up to 15 at.% and the concurrent formation of orthorhombic regions are observed. This is consistent with density functional theory calculations indicating that the orthorhombic structures with and without Ga are more stable than the corresponding FCC compositions probed here. In contrast, Xe+ plasma FIB preparation did not alter the microstructure and the maximum Xe-content reached only 0.2 at.%. TEM-analysis did not reveal significant strain differences of the Al-Ni solid solution and Al3Ni. Hence, we recommend the use of Xe+-pFIB for sample preparation of alloys which are sensitive to Ga-induced phase transformations such as Al95Ni5 to prevent misinterpretation.

権利情報:

• Creative Commons BY Attribution 4.0 International
  

キーワード: Nanocrystalline aluminium, Intermetallic phases, Phase transformation, Gallium, Focused Ion Beam (FIB) sample preparation

刊行年月日: 2025-02-09

出版者: Elsevier BV

掲載誌:

• Scripta Materialia (ISSN: 13596462) vol. 260 116589

研究助成金:

• Ministerium für Innovation, Wissenschaft und Forschung des Landes Nordrhein-Westfalen
• Innosuisse Swiss Innovation Agency 109.352.1 “ORALCOAT”
• Innosuisse Swiss Innovation Agency 42220.1 IP-ENG
• NHR Center NHR4CES p0020883
• Polish National Agency for Academic Exchange Polish Returns Programme

原稿種別: 出版者版 (Version of record)

MDR DOI:

公開URL: https://doi.org/10.1016/j.scriptamat.2025.116589

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更新時刻: 2025-02-23 22:49:58 +0900

MDRでの公開時刻: 2025-02-23 22:49:58 +0900