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Description:

We report the strain visualization method using large-angle convergent-beam electron diffraction (LACBED). We compare the proposed method with the strain maps acquired by STEM-NBD, a combination of scanning transmission electron microscopy (STEM) and nanobeam electron diffraction (NBD). Deficiency lines in the transmitted disk of the LACBED emanate from the movement, curving, or disappearance in a deformed area, and they contain information on the crystalline structure. Properly setting the optical conditions makes it possible to acquire real-space images over a wide area, together with deficiency lines on the transmitted disk. The proposed method acquires images by changing the relative position between the specimen and the deficiency line and can grasp the strain information with a small number of images. The curving or moving direction of the deficiency line is qualitatively consistent with the NBD results. If quantitative strain values are not essential, strain visualization using LACBED can be considered an effective technique. We believe that the strain information of a sample can be obtained effectively using both methods.

Rights:

• Creative Commons BY-NC-ND Attribution-NonCommercial-NoDerivs 4.0 International
  

Keyword: LACBED, NBD, Strain analysis

Date published: 2024-04-10

Publisher: Elsevier BV

Journal:

• ULTRAMICROSCOPY (ISSN: 03043991) vol. 261 113966

Funding:

Manuscript type: Author's version (Accepted manuscript)

MDR DOI: https://doi.org/10.48505/nims.4562

First published URL: https://doi.org/10.1016/j.ultramic.2024.113966

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Updated at: 2024-07-01 14:11:45 +0900

Published on MDR: 2026-04-11 08:20:03 +0900