Download file (7.49MB)
Download as zip (7.37MB)

コレクション

引用

説明:

We report the strain visualization method using large-angle convergent-beam electron diffraction (LACBED). We compare the proposed method with the strain maps acquired by STEM-NBD, a combination of scanning transmission electron microscopy (STEM) and nanobeam electron diffraction (NBD). Deficiency lines in the transmitted disk of the LACBED emanate from the movement, curving, or disappearance in a deformed area, and they contain information on the crystalline structure. Properly setting the optical conditions makes it possible to acquire real-space images over a wide area, together with deficiency lines on the transmitted disk. The proposed method acquires images by changing the relative position between the specimen and the deficiency line and can grasp the strain information with a small number of images. The curving or moving direction of the deficiency line is qualitatively consistent with the NBD results. If quantitative strain values are not essential, strain visualization using LACBED can be considered an effective technique. We believe that the strain information of a sample can be obtained effectively using both methods.

権利情報:

• Creative Commons BY-NC-ND Attribution-NonCommercial-NoDerivs 4.0 International
  

キーワード: LACBED, NBD, Strain analysis

刊行年月日: 2024-04-10

出版者: Elsevier BV

掲載誌:

• ULTRAMICROSCOPY (ISSN: 03043991) vol. 261 113966

研究助成金:

原稿種別: 著者最終稿 (Accepted manuscript)

MDR DOI: https://doi.org/10.48505/nims.4562

公開URL: https://doi.org/10.1016/j.ultramic.2024.113966

関連資料:

その他の識別子:

連絡先:

更新時刻: 2024-07-01 14:11:45 +0900

MDRでの公開時刻: 2026-04-11 08:20:03 +0900